E4237ALP Semtech, E4237ALP Datasheet - Page 14
![no-image](/images/manufacturer_photos/0/5/595/semtech_sml.jpg)
E4237ALP
Manufacturer Part Number
E4237ALP
Description
Manufacturer
Semtech
Datasheet
1.E4237ALP.pdf
(39 pages)
Specifications of E4237ALP
Operating Temperature (max)
85C
Operating Temperature Classification
Commercial
Mounting
Surface Mount
Lead Free Status / RoHS Status
Not Compliant
In FV mode, VINP is a high impedance analog input that
sets the output voltage at the RF and/or FORCE output
pins across their specified ranges as follows:
Force Current (FI) Mode
In the FI mode (FV/FI* = 0), the negative feedback to the
force amplifier is provided from the output of a 4x gain
instrument amplifier that senses the voltage across REXT.
In FI mode, VINP is a high impedance analog input that
sets the output current at the RF and/or FORCE pins across
their specified compliance voltage ranges as follows:
The nominal relationship between V
at the FORCE or RF pins is displayed in Table 8.
Measure Current (MI) Mode
In the MI mode (MI/MV* = 1), the current through REXT is
sensed using a 4x gain instrument amplifier, and the
resulting measurement can be tested using the on-chip
window comparator or routed to the IVMON pin.
TEST AND MEASUREMENT PRODUCTS
Circuit Description (continued)
V
Table 8. Nominal Forced Current/V
2005 Semtech Corp. / Rev. 5, 11/30/05
specified Offset Current
specified Offset Voltage
FORCE/RF
I
FORCE/RF
VINP
= V
V
+
–
V
0
2
2
N I
V
VINP
V
V
P
=
+
–
Force
Amp.
V
VINP
V
VINP
x specified FI Gain
+
REXT
4X
specified Linearity Error
specified Linearity Error
x specified Gain Error
+
–
–
F
F
l l u
l l u
I
S -
S -
F
VINP
O
VINP
a c
a c
R
C
0
FORCE/RF
e l
e l
E
/
and the current
C
C
Relationship
R
F
r u
r u
e r
e r
t n
t n
14
In the MI mode, the voltage displayed at IVMON relates
to the current measured through REXT as follows:
The nominal relationship between the current measured
(I
in Table 9.
Measure Voltage (MV) Mode
In the MV mode (MI/MV* = 0), DUT compliance voltage
is monitored using the SENSE pin, and the resulting
measurement can be tested using the on-chip window
comparator, or routed to the IVMON pin.
In the MV mode, the voltage monitored at SENSE maps
1:1 with the voltage measured at IVMON as follows:
measured
V
SENSE
IVMON
Output of
Force Amp
V
Table 9. Nominal
IVMON
specified MI Gain
+
–
) and the voltage displayed at IVMON is depicted
= V
F
F
l u
l u
Voltage
= I
S - l
S - l
I
m
SENSE
measured
a c
a c
+
e
–
s a
0
E4237/E4257/E4287
e l
e l
r u
d e
u C
u C
x specified Gain
e r r
e r r
I measured
+
specified Linearity Error
V
REXT
t n
t n
IVMON
4X
–
Specified Linearity Error x
specified Offset Current
/I
measured
Measured voltage can be
tested with window comparator
or routed to the IVMON pin.
V
FORCE/RF
Measured current can
be tested with window
comparator or routed to
IVMON
V I
+
–
V 0
V 2
V 2
M
specified Offset
Relationship
O
N
www.semtech.com