STK15C88-NF25ITR Cypress Semiconductor Corp, STK15C88-NF25ITR Datasheet - Page 8

• Manufacturer Part Number: STK15C88-NF25ITR
• Description: STK15C88-NF25ITR
• Manufacturer: Cypress Semiconductor Corp
• Type: NVSRAMr

Specifications of STK15C88-NF25ITR

• Format - Memory: RAM
• Memory Type: NVSRAM (Non-Volatile SRAM)
• Memory Size: 256K (32K x 8)
• Speed: 25ns
• Interface: Parallel
• Voltage - Supply: 4.5 V ~ 5.5 V
• Operating Temperature: -40°C ~ 85°C
• Package / Case: 28-SOIC (7.5mm Width)
• Word Size: 8b
• Organization: 32Kx8
• Density: 256Kb
• Interface Type: Parallel
• Access Time (max): 25ns
• Operating Supply Voltage (typ): 5V
• Package Type: SOIC
• Operating Temperature Classification: Industrial
• Operating Supply Voltage (max): 5.5V
• Operating Supply Voltage (min): 4.5V
• Operating Temp Range: -40C to 85C
• Pin Count: 28
• Mounting: Surface Mount
• Supply Current: 100mA
• Lead Free Status / RoHS Status: Contains lead / RoHS non-compliant
• Lead Free Status / RoHS Status: Contains lead / RoHS non-compliant

Data Retention and Endurance
Capacitance
In the following table, the capacitance parameters are listed.
Thermal Resistance
In the following table, the thermal resistance parameters are listed.
AC Test Conditions
Input Pulse Levels .................................................. 0 V to 3 V
Input Rise and Fall Times (10% - 90%)........................ <5 ns
Input and Output Timing Reference Levels ................... 1.5 V
Document Number: 001-50593 Rev. *B
DATA
NV
C
C
Note
4. These parameters are guaranteed by design and are not tested.
IN
OUT
Parameter
C
Θ
Θ
R
Parameter
Parameter
JA
JC
Thermal Resistance
(Junction to Ambient)
Thermal Resistance
(Junction to Case)
Description
Input Capacitance
Output Capacitance
Data Retention
Nonvolatile STORE Operations
Description
Output
5.0V
Description
Test conditions follow standard test methods and
procedures for measuring thermal impedance,
per EIA / JESD51.
30 pF
Figure 4. AC Test Loads
T
V
A
CC
[4]
Test Conditions
= 25°C, f = 1 MHz,
= 0 to 3.0 V
R1 480Ω
[4]
Test Conditions
255Ω
R2
1,000
Min
100
(300 mil)
28-SOIC
TBD
TBD
Max
5
7
(330 mil)
28-SOIC
TBD
TBD
STK15C88
Page 8 of 16
Years
Unit
Unit
K
pF
pF
°C/W
°C/W
Unit
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