SST89E58RD2-40-C-NJE Microchip Technology, SST89E58RD2-40-C-NJE Datasheet - Page 67

• Manufacturer Part Number: SST89E58RD2-40-C-NJE
• Description: 4.5 To 5.5V FlashFlex 8-bit 8051 Microcontroller 44 PLCC TUBE
• Manufacturer: Microchip Technology
• Series: FlashFlex®r

Specifications of SST89E58RD2-40-C-NJE

• Core Processor: 8051
• Core Size: 8-Bit
• Speed: 40MHz
• Connectivity: EBI/EMI, SPI, UART/USART
• Peripherals: Brown-out Detect/Reset, POR, WDT
• Number Of I /o: 36
• Program Memory Size: 32KB (32K x 8)
• Program Memory Type: FLASH
• Eeprom Size: 8K x 8
• Ram Size: 1K x 8
• Voltage - Supply (vcc/vdd): 4.5 V ~ 5.5 V
• Oscillator Type: External
• Operating Temperature: 0°C ~ 70°C
• Package / Case: 44-LCC (J-Lead)
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant
• Data Converters: -
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant

FlashFlex MCU
SST89E54RD2A/RDA / SST89E58RD2A/RDA
TABLE 14-2: Reliability Characteristics
TABLE 14-3: AC Conditions of Test
TABLE 14-4: Recommended System Power-up Timings
TABLE 14-5: Pin Impedance (VDD=3.3V, TA=25 °C, f=1 Mhz, other pins open)
©2008 Silicon Storage Technology, Inc.
Symbol
N
T
I
Input Rise/Fall Time . . . . . . . . . . . . . . . 10 ns
Output Load . . . . . . . . . . . . . . . . . . . . . C
See Figures 14-7 and 14-9
Symbol
T
T
Parameter
C
C
L
LTH
DR
PU-READ
PU-WRITE
PIN
END
I/O
IN
1. This parameter is measured only for initial qualification and after a design or process change that could affect this parameter.
1. This parameter is measured only for initial qualification and after a design or process change that could affect this parameter
1. This parameter is measured only for initial qualification and after a design or process change that could affect this parameter.
2. Refer to PCI spec.
1
1
1
1
2
1
1
1
Parameter
Power-up to Read Operation
Power-up to Write Operation
Description
I/O Pin Capacitance
Input Capacitance
Pin Inductance
Parameter
Endurance
Data Retention
Latch Up
L
= 100 pF
T14-3.0 1339
Minimum Specification
67
100 + I
10,000
100
DD
Test Condition
Cycles
Units
Years
mA
Minimum
V
V
I/O
IN
100
100
= 0V
= 0V
Test Method
JEDEC Standard A117
JEDEC Standard A103
JEDEC Standard 78
S71339-02-000
Maximum
20 nH
15 pF
12 pF
Units
Data Sheet
µs
µs
T14-2.0 1339
T14-4.0 1339
T14-5.0 1339
02/08