PIC18F45K80T-I/PT Microchip Technology, PIC18F45K80T-I/PT Datasheet - Page 250
![ECAN, 32KB Flash, 4KB RAM, 16 MIPS, 12-bit ADC, CTMU 44 TQFP 10x10x1mm T/R](/photos/16/13/161303/tqfp44_sml.jpg)
PIC18F45K80T-I/PT
Manufacturer Part Number
PIC18F45K80T-I/PT
Description
ECAN, 32KB Flash, 4KB RAM, 16 MIPS, 12-bit ADC, CTMU 44 TQFP 10x10x1mm T/R
Manufacturer
Microchip Technology
Series
PIC® XLP™ 18Fr
Datasheet
1.PIC18F25K80-ISO.pdf
(628 pages)
Specifications of PIC18F45K80T-I/PT
Core Processor
PIC
Core Size
8-Bit
Speed
64MHz
Connectivity
ECAN, I²C, LIN, SPI, UART/USART
Peripherals
Brown-out Detect/Reset, LVD, POR, PWM, WDT
Number Of I /o
35
Program Memory Size
32KB (16K x 16)
Program Memory Type
FLASH
Eeprom Size
1K x 8
Ram Size
3.6K x 8
Voltage - Supply (vcc/vdd)
1.8 V ~ 5.5 V
Data Converters
A/D 11x12b
Oscillator Type
Internal
Operating Temperature
-40°C ~ 85°C
Package / Case
*
Processor Series
PIC18F45K80
Core
PIC
Data Bus Width
8 bit
Data Ram Size
1 KB
Interface Type
I2C, SPI, USART
Maximum Clock Frequency
64 MHz
Number Of Programmable I/os
35
Number Of Timers
5
Operating Supply Voltage
1.8 V to 5.5 V
Maximum Operating Temperature
+ 85 C
Mounting Style
SMD/SMT
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Available stocks
Company
Part Number
Manufacturer
Quantity
Price
Company:
Part Number:
PIC18F45K80T-I/PT
Manufacturer:
Microchip Technology
Quantity:
10 000
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PIC18F66K80 FAMILY
18.4.2
There is a small amount of capacitance from the inter-
nal A/D Converter sample capacitor as well as stray
capacitance from the circuit board traces and pads that
affect the precision of capacitance measurements. A
measurement of the stray capacitance can be taken by
making sure the desired capacitance to be measured
has been removed.
After removing the capacitance to be measured:
1.
2.
3.
4.
5.
6.
Where:
• I is known from the current source measurement
• t is a fixed delay
• V is measured by performing an A/D conversion
DS39977C-page 250
step
Initialize the A/D Converter and the CTMU.
Set EDG1STAT (= 1 ).
Wait for a fixed delay of time, t .
Clear EDG1STAT.
Perform an A/D conversion.
Calculate the stray and A/D sample capacitances:
C
CAPACITANCE CALIBRATION
OFFSET
= C
STRAY
+ C
AD
= (I • t)/V
Preliminary
This measured value is then stored and used for
calculations of time measurement or subtracted for
capacitance measurement. For calibration, it is
expected that the capacitance of C
approximately known; C
An iterative process may be required to adjust the time,
t , that the circuit is charged to obtain a reasonable volt-
age reading from the A/D Converter. The value of t may
be determined by setting C
and solving for t . For example, if C
calculated to be 11 pF, and V is expected to be 70% of
V
or 63 s.
See
capacitance calibration.
DD
or 2.31V, t would be:
Example 18-3
(4 pF + 11 pF) • 2.31V/0.55 A
for a typical routine for CTMU
2011 Microchip Technology Inc.
AD
OFFSET
is approximately 4 pF.
to a theoretical value
STRAY
STRAY
is theoretically
+ C
AD
is
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