DA82562ET Intel, DA82562ET Datasheet - Page 12
![](/photos/31/26/312666/57648ssop_sml.jpg)
DA82562ET
Manufacturer Part Number
DA82562ET
Description
Manufacturer
Intel
Datasheet
1.DA82562ET.pdf
(40 pages)
Specifications of DA82562ET
Operating Supply Voltage (typ)
3.3V
Operating Supply Voltage (min)
3V
Operating Supply Voltage (max)
3.45V
Operating Temperature Classification
Commercial
Mounting
Surface Mount
Pin Count
48
Lead Free Status / RoHS Status
Not Compliant
Available stocks
Company
Part Number
Manufacturer
Quantity
Price
Company:
Part Number:
DA82562ET
Manufacturer:
HARRIS
Quantity:
117
Part Number:
DA82562ET
Manufacturer:
INTEL
Quantity:
20 000
82562ET — Networking Silicon
3.8
8
Power and Ground Connections
ISOL_TEX
TOUT
TESTEN
VCC
VCCP
VCCA
VCCA2
VCCT
VSS
VSSP
VSSA
VSSA2
VCCR
VSSR
Pin Name
Pin Name
29
26
21
1, 25
36, 40
2,
7,
9, 12,
14, 17
8, 13, 18
24, 48
33, 38
3
6
19, 23
20, 22
Number
Number
Pin
Pin
I
O
I
DPS
DPS
APS
APS
Type
Type
Test Execute. The Test Execute signal sets the device into asynchronous
test mode in conjunction with the Test Clock, Test Input, and Test Enable
pins (refer to
In the manufacturing test mode, it places the command that was entered
through the TI pin in the instruction register.
Note: ISOL_TEX has an internal pull-down resistor.
Test Output. The Test Output pin is used for Boundary XOR scan output.
In the manufacturing test mode, it acts as the test output port.
Test Enable. The Test Enable pin is used to enable test mode and should
be externally pulled up to V
Digital 3.3 V Power. These pins should be connected to the main digital
power supply.
Digital Ground. These pins should be connected to the main digital
ground.
Analog Power.
Analog Ground. These pins should not be isolated from the main digital.
Table 1, “82562ET Hardware Configuration” on page
CC
to enable XOR Tree test mode.
Description
Description
Datasheet
3).