5962-8670901XA QP SEMICONDUCTOR, 5962-8670901XA Datasheet - Page 6

• Manufacturer Part Number: 5962-8670901XA
• Manufacturer: QP SEMICONDUCTOR

Specifications of 5962-8670901XA

• Lead Free Status / RoHS Status: Not Compliant

DSCC FORM 2234
APR 97
1/
2/
3/
4/
5/
6/
7/
8/
9/
Propagation delay time,
Propagation delay
Pulse width, CLK high
Pulse width, CLK period
Pulse width, CLK period
Pulse width, preset
Setup time, input to CLK
Setup time, input to CLK
Setup time,
Setup time, preset 8/
Hold time, CLK to input
power-on preset
time, preset
and CLK low 9/
(through complement
array) 9/
(through complement
array) 8/
power-on preset
All voltage values are with respect to ground.
Test one pin at a time.
Measured with a programmed logic condition for which the output is at a low logic level and V
sink current is supplied through a resistor to V
Measured with V
Duration of short-circuit should not exceed 1 second.
I
Measured with V
Not testable on unprogrammed devices.
To prevent spurious clocking, clock rise time (10% to 90%)
CC
is measured with the PR/ OE input grounded and the outputs open.
DEFENSE SUPPLY CENTER COLUMBUS
Test
MICROCIRCUIT DRAWING
COLUMBUS, OHIO 43216-5000
IL
IH
applied to OE and a logic high stored or with V
STANDARD
applied to PR/ OE .
t
t
t
t
t
t
t
t
t
t
t
t
Symbol
PPR
PR
CKH
CKL
CKP
CKP
PRH
IS
IS
VS
PRS
IH
TABLE I. Electrical performance characteristics.
V
R
C
See figure 4
unless otherwise specified
CC
1
L
= 470Ω, R
= 30 pF,
-55 C
= 5.0 V
V
CC
Conditions 1/
CC
= 5.0 V
.
T
C
2
= 1 kΩ
+125 C
30 ns.
SIZE
IH
A
applied to PR.
subgroups
9, 10, 11
Group A
REVISION LEVEL
Device
type
All
01
02
01
02
01
02
All
All
01
02
01
02
All
All
All
E
IL
135
100
applied to PR/ OE . Output
Min
40
12
95
24
40
60
18
40
10
5
5
Limits
Max
SHEET
20
45
25
5962-86709
6
Unit
ns