TLF14CB1021R5 Taiyo Yuden, TLF14CB1021R5 Datasheet - Page 9

• Manufacturer Part Number: TLF14CB1021R5
• Description: CHOKE COMMON MODE 1000UH
• Manufacturer: Taiyo Yuden
• Series: TLF14CBr

Specifications of TLF14CB1021R5

• Inductance: 1mH
• Current: 1.5A
• Dc Resistance (dcr): 100.0 mOhm Max
• Filter Type: Common Mode - 2 Line Array
• Package / Case: 0.867" L x 0.669" W x 0.906" H (22.00mm x 17.00mm x 23.00mm)
• Mounting Type: Through Hole
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant
• Impedance: -

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20.Low temperature life test
21.High Temperature life test
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RELIABILITY DATA
当社カタログをご使用の際には 「当社製品に関するお断り」 を必ずお読みください。
Item
Appearance：No abnormality
Inductance change ： Refer to individual specifi-
cation
Appearance：No abnormality
Inductance change ： Refer to individual specifi-
cation
BUーRA Type
CMーRA/
CMーRB Type
Specified Value
・Withstanding voltage：No abnormality
・Insulation resistance：No abnormality
・Withstanding voltage：No abnormality
・Insulation resistance：No abnormality
TLF9U・TLF25RA：
Inductance change：Within±15％
TLF14CB：
TLF9U・TLF25RA：
Inductance change：Within±15％
TLF14CB：
TLF14CB
TLF9U
TLF25RA
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！
Please read the "Notice for TAIYO YUDEN products" before using this catalog.
CM：
Temperature：ー40±3℃
Duration：500 （＋12, ー0） hrs
Recovery：1 to 2hrs of recovery under the standard con-
TLF：
Temperature：ー25±2℃
※TLF14CB Temperature：ー40±2℃
Duration：500 hrs
Recovery ： At least 1hr of recovery under the standard
CM：
Temperature：85±2℃
Duration：500 （＋12, ー0） hrs
Recovery：1 to 2hrs of recovery under the standard con-
TLF：
Temperature：85±2℃
※TLF14CB Temperature：105±3℃
Duration：500 hrs
Recovery ： At least 1hr of recovery under the standard
： 1 to 2hrs of recovery under the standard con-
：1 to 2hrs of recovery under the standard con-
（CMーRA）
（CMーRB）
（CMーRA）
（CMーRB）
dition after the removal from test chamber.
dition after the removal from test chamber.
removal from test chamber followed by the
measurement within 2 hrs.
dition after the removal from test chamber.
dition after the removal from test chamber.
removal from test chamber followed by the
measurement within 2 hrs.
Test method and remarks
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