GNM3145C2A180KD01D Murata, GNM3145C2A180KD01D Datasheet - Page 4
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GNM3145C2A180KD01D
Manufacturer Part Number
GNM3145C2A180KD01D
Description
Manufacturer
Murata
Type
Ceramicr
Datasheet
1.GNM3145C2A180KD01D.pdf
(6 pages)
Specifications of GNM3145C2A180KD01D
Capacitance
18pF
No. Of Capacitors
4
Tolerance (+ Or -)
10%
Voltage
100VDC
Number Of Terminals
8Terminal
Temp Coeff (dielectric)
C0G
Operating Temp Range
-55C to 125C
Mounting Style
Surface Mount
Package / Case
1206
Construction
SMT Chip
Failure Rate
Not Required
Product Height (mm)
0.8mm
Product Depth (mm)
1.6mm
Product Length (mm)
3.2mm
Lead Diameter (nom)
Not Requiredmm
Terminal Pitch
0.8mm
Lead Free Status / RoHS Status
Compliant
Available stocks
Company
Part Number
Manufacturer
Quantity
Price
Company:
Part Number:
GNM3145C2A180KD01D
Manufacturer:
MURATA
Quantity:
120 000
!Note
!Note
No.
10
1
2
3
4
5
6
7
8
9
Capacitance
Temperature
Characteristics
Operating
Temperature Range
Rated Voltage
Appearance
Dimension
Dielectric Strength
Insulation Resistance
Capacitance
Q/Dissipation Factor
(D.F.)
Adhesive Strength
of Termination
• Please read rating and !CAUTION (for storage, operating, rating, soldering, mounting and handling) in this catalog to prevent smoking and/or burning, etc.
• This catalog has only typical specifications because there is no space for detailed specifications. Therefore, please approve our product specifications or transact the approval sheet for product specifications before ordering.
Please read rating and !CAUTION (for storage, operating, rating, soldering, mounting and handling) in this PDF catalog to prevent smoking and/or burning, etc.
This catalog has only typical specifications. Therefore, you are requested to approve our product specifications or to transact the approval sheet for product specificaions before ordering.
Item
Temperature
Coefficient
Capacitance
Drift
Capacitance
Change
5C : Y55D to +125D
See the previous pages.
No defects or abnormalities
Within the specified dimensions
No defects or abnormalities
More than 10,000MΩ or 500Ω • F
(Whichever is smaller)
Within the specified tolerance
30pF min. : QU1000
30pF max. : QU400+20C
C : Nominal Capacitance
Within the specified
tolerance (Table A)
Within the specified
tolerance (Table A)
Within T0.2% or T0.05 pF
(Whichever is larger)
No removal of the terminations or other defect should occur.
Compensating Type
(pF)
Temperature
Specifications
b
a
Char.
Char.
R7 : Y55D to +125D
F5 : Y30D to +85D
R7
R7
F5
F5
Y55 to W125D
Copper foil
0.025 max.
Y30 to W85D
25V min.
0.05 max.
Range
Solder resist
Temp.
High Dielectric Type
0.035 max.
Reference
0.07 max.
Temp.
25D
16V
WithinT
WithinT15%
0.035 max.
Change
Cap.
10V
W22
Y82
Y
%
The rated voltage is defined as the maximum voltage which
may be applied continuously to the capacitor.
When AC voltage is superimposed on DC voltage, V
whichever is larger, should be maintained within the rated volt-
age range.
Visual inspection
Using calipers
No failure should be observed when 300% of the rated voltage
(5C) or 250% of the rated voltage (R7, F5) is applied between
the terminations for 1 to 5 seconds, provided the charge/dis-
charge current is less than 50mA.
The insulation resistance should be measured with a DC volt-
age not exceeding the rated voltage at 25D and 75%RH max.
and within 2 minutes of charging.
The capacitance/Q/D.F. should be measured at 25D at the fre-
quency and voltage shown in the table.
The capacitance change should be measured after 5 min. at
each specified temperature stage.
(1) Temperature Compensating Type
(2) High Dielectric Constant Type
Solder the capacitor to the test jig (glass epoxy board) shown in
Fig. 1 using a eutectic solder. Then apply 5N force in parallel
with the test jig for 10T1 sec.
The soldering should be done either with an iron or using the
reflow method and should be conducted with care so that the
soldering is uniform and free of defects such as heat shock.
Specifications and Test Methods
Item
The temperature coefficient is determined using the
capacitance measured in step 3 as a reference.
When cycling the temperature sequentially from step1
through 5, the capacitance should be within the specified
tolerance for the temperature coefficient and capacitance
change as Table A.
The capacitance drift is calculated by dividing the
differences between the maximum and minimum measured
values in steps 1, 3 and 5 by the capacitance value in step 3.
The ranges of capacitance change compared with the
above 25D value over the temperature ranges shown in the
table should be within the specified ranges.
GNM1M
GNM21
GNM31
Frequency
Voltage
Type
Step
1
2
3
4
5
Char.
Y55T3 (for 5C/ R7), Y30T3 (for F5)
0.5
0.4
0.8
a
0.5 to 5Vr.m.s.
Test Method
125T3 (for 5C/R7), 85T3 (F5)
1T0.1MHz
Fig. 1
5C
Continued on the following page.
Temperature (D)
1.6
2.5
Y
b
25T2
25T2
25T2
0.32
0.25
C02E10.pdf 04.1.20
0.4
1.0T0.2Vr.m.s.
c
1T0.1kHz
R7, F5
P-P
(in mm)
0.32
0.5
0.8
or V
d
O-P
,
45
8