BU323ZG ON Semiconductor, BU323ZG Datasheet - Page 4

• Manufacturer Part Number: BU323ZG
• Description: TRANS DARL NPN 350V 10A TO-218
• Manufacturer: ON Semiconductor

Specifications of BU323ZG

• Transistor Type: NPN - Darlington
• Current - Collector (ic) (max): 10A
• Voltage - Collector Emitter Breakdown (max): 350V
• Vce Saturation (max) @ Ib, Ic: 1.7V @ 250mA, 10A
• Current - Collector Cutoff (max): 100µA
• Dc Current Gain (hfe) (min) @ Ic, Vce: 500 @ 5A, 4.6V
• Power - Max: 150W
• Frequency - Transition: 2MHz
• Mounting Type: Through Hole
• Package / Case: SOT-93, TO-218 (Straight Leads)
• Configuration: Single
• Transistor Polarity: NPN
• Mounting Style: SMD/SMT
• Collector- Emitter Voltage Vceo Max: 350 V
• Emitter- Base Voltage Vebo: 6 V
• Maximum Dc Collector Current: 10 A
• Maximum Collector Cut-off Current: 100 uA
• Maximum Operating Temperature: + 175 C
• Dc Collector/base Gain Hfe Min: 150
• Minimum Operating Temperature: - 65 C
• Collector Emitter Voltage V(br)ceo: 350V
• Power Dissipation Pd: 150W
• Dc Collector Current: 10A
• Dc Current Gain Hfe: 500
• Operating Temperature Range: -65°C To +175°C
• Rohs Compliant: Yes
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant

I
I
I
I
CPEAK
CPEAK
CPEAK
CPEAK
I
I
I
I
C
C
C
C
(a)
(b)
(c)
(d)
Figure 4. Energy Test Criteria for BU323Z
I
I
I
I
I
I
I
I
C
C
C
C
C
C
C
C
V
V
V
V
HIGH
LOW
HIGH
LOW
HIGH
LOW
HIGH
LOW
GATE
GATE
GATE
GATE
MIN
MIN
MIN
MIN
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V
V
V
V
CE
CE
CE
CE
4
device can sustain, under given DC biases (I
R
gram, Figure 2.
load and I
the shaded area and greater than the V
Figure 4a.
(minimum limit) at any point along the V
shown on Figures 4b, and 4c. This assures that hot spots and
uncontrolled avalanche are not being generated in the die,
and the transistor is not damaged, thus enabling the sustained
energy level required.
voltage is less than the V
BE
The shaded area represents the amount of energy the
The transistor PASSES the Energy test if, for the inductive
The transistor FAILS if the V
The transistor FAILS if its Collector/Emitter breakdown
), without an external clamp; see the test schematic dia-
CPEAK
/I
B
/V
BE(off)
GATE
biases, the V
value, Figure 4d.
CE
is less than the V
GATE
CE
minimum limit,
remains outside
CE
C
/I
/I
C
B
/V
curve as
BE(off)
GATE
/