A50QH1470AA00K Kemet, A50QH1470AA00K Datasheet - Page 3

• Manufacturer Part Number: A50QH1470AA00K
• Description: Cap Film 0.0047uF 1000VDC/250VAC PET 10% 7.5 X 14mm AXL Bulk
• Manufacturer: Kemet

Specifications of A50QH1470AA00K

• Package/case: 7.5(Max) X 14(Max)
• Mounting: Through Hole
• Capacitance Value: 0.0047 uF
• Voltage: 1000|250 Vdc|Vac
• Dielectric: PET
• Product Length: 14(Max) mm
• Tolerance: 10 %
• Operating Temperature: -55 to 105 °C
• Capacitance: 4700 pF
• Voltage Rating: 1 KVolts
• Termination Style: Axial
• Operating Temperature Range: - 55 C to + 105 C
• Product: Metallized Polyester Film Capacitors
• Lead Free Status / Rohs Status: Details

eleCTRICAl ChARACTeRISTICS
Rated voltage (V
Rated temperature (T
Temperature derated voltage:
for temperatures between +85°C and +105°C a decreasing
factor of 1.25% per degree °C on the rated voltage V
and a.c.) has to be applied.
Capacitance range:
Capacitance values:
Capacitance tolerances (measured at 1 kHz):
±5% (J); ±10% (K); ±20% (M).
Total self-inductance (L): ≈ 7nH
max 1 nH per 1 mm lead and capacitor length.
Dissipation factor (DF):
tgδ 10
Insulation resistance:
Test voltage between terminations:
1.6xV
100
kHz
10
Test conditions
Temperature:
Voltage charge time:
Voltage charge:
Performance
For V
≥ 3750 MΩ for C ≤ 0.33µF
≥ 1000 s
For V
≥ 30000 MΩ for C ≤ 0.33µF
≥ 10000 s
*Typical value
1
R
-4
applied for 2 s at +25°C±5°C.
at +25°C ±5°C
R
R
C
≤
≤
≤
≤100 Vdc
>100 Vdc
≤
150
250
0.1
80
µ
F
for C > 0.33µF
for C > 0.33µF
400 Vdc
R
):
50 Vdc
0.1µF<C
R
):
≤
≤
150
80
+25°C±5°C
1 min
50 Vdc
100 Vdc for V
630 Vdc 1000 Vdc
+85 °C
1000pF to 10µF
e6 series (IeC 60063 Norm).
63 Vdc
≤
1
µ
F
(50000 MΩ)*
(5000 s)*
(50000 MΩ)*
(17000 s)*
for V
100 Vdc
C >1
≤
100
R
R
µ
<100 Vdc
≥100 Vdc
F
250 Vdc
R
(d.c.
23
MeTAllIZeD POlyeSTeR FIlM CAPACITOR
D.C. MulTIPuRPOSe APPlICATIONS
PRoDUCT CoDe: A50
TeST MeThOD AND PeRFORMANCe
Damp heat, steady state:
endurance:
Resistance to soldering heat:
long term stability (after two years):
RelIABIlITy:
Test conditions
Temperature:
Relative humidity (RH):
Test duration:
Performance
Capacitance change |∆C/C|: ≤ 5%
DF change (∆tgδ):
Insulation resistance:
Test conditions
Temperature:
Test duration:
Voltage applied:
Performance
Capacitance change |∆C/C|: ≤ 5%
DF change (∆tgδ):
Insulation resistance:
Test conditions
Solder bath temperature:
Dipping time (with heat screen):10 s±1 s
Performance
Capacitance change |∆C/C|: ≤2%
DF change (∆tgδ):
Insulation resistance:
Storage: standard environmental conditions (see page 12).
Performance
Capacitance change |∆C/C|: ≤ 3% for C≤ 0.1µF
Reference MIL HDB 217
Application conditions:
Temperature:
Voltage:
Failure rate:
(1 FIT = 1x10
Failure criteria:
(according to DIN 44122)
Short or open circuit
Capacitance change |∆C/C|: >10%
DF change (∆tgδ):
Insulation resistance:
-9
failures/components x h)
≤ 30x10
≤ 20x10
≤ 30x10
≤ 20x10
≤ 2% for C> 0.1µF
+40°C±2°C
93% ±2%
56 days
≤ 50x10
≥ 50% of initial limit.
+85°C ±2°C
2000 h
1.25xV
≥ 50% of initial limit.
+260°C±5°C
≥ initial limit.
+40°C±2°C
0.5xV
≤ 5 FIT
>2 x initial limit.
<0.005 x initial limit.
-4
-4
-4
-4
at 10kHz for C≤ 1µF
at 1kHz for C> 1µF
at 10kHz for C≤ 1µF
at 1kHz for C> 1µF
R
R
-4
at 1kHz
MKT Series
A50
09/2008