NTMS4107NR2G ON Semiconductor, NTMS4107NR2G Datasheet - Page 2

• Manufacturer Part Number: NTMS4107NR2G
• Description: MOSFET N-CH 30V 11A 8-SOIC
• Manufacturer: ON Semiconductor

Specifications of NTMS4107NR2G

• Fet Type: MOSFET N-Channel, Metal Oxide
• Fet Feature: Logic Level Gate
• Rds On (max) @ Id, Vgs: 4.5 mOhm @ 15A, 10V
• Drain To Source Voltage (vdss): 30V
• Current - Continuous Drain (id) @ 25° C: 11A
• Vgs(th) (max) @ Id: 2.5V @ 250µA
• Gate Charge (qg) @ Vgs: 45nC @ 4.5V
• Input Capacitance (ciss) @ Vds: 6000pF @ 15V
• Power - Max: 930mW
• Mounting Type: Surface Mount
• Package / Case: 8-SOIC (3.9mm Width)
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant
• Other names: NTMS4107NR2G; NTMS4107NR2GOSTR

Update Notification #16265
Reliability Data Summary:
SO8 Device: NTMS4177PR2G
Test: High Temperature Reverse Bias (HTRB)
Conditions: Ta=150'C, Vds= 80% BVdss Rating, Duration : 1008-Hrs, 3-Lots
Results: 0/240
Test: High Temperature Gate Bias (HTGB)
Conditions: Ta=150'C, Vds= 100% Vgs Rating, Duration : 1008-Hrs, 3-Lots
Results: 0/240
Test: High Temperature Storage Life (HTSL)
Conditions: Ta=150'C, Duration : 1008-Hrs, 3-Lots
Results: 0/240
Test: Intermittent Operating Life (IOL-PC)
Conditions: Ta=25'C, delta Tj=100'C, 2-min on/off, 15K- cy, 3-Lots
Results: 0/240
Test: Temperature Cycling (TC-PC)
Conditions: Ta=-65'C/150'C, Air-to-Air, Dwell >=10-min, 500-cy, 3-Lots
Results: 0/240
Test: Autoclave Test (AC-PC)
Conditions: Ta=121'C, P=15psi, RH=100%, Duration: 96-Hrs, 3-Lots
Results: 0/240
Test: Highly Accelerated Stress Test (HAST)
Conditions: Ta=130'C, RH=85%, Duration: 96-Hrs, 3-Lots
Results: 0/240
Schottky Die: DR0734 and DR0733
Test: High Temperature Reverse Bias (HTRB)
Conditions: Ta=150'C, Vds= 80% BVdss Rating, Duration : 1008-Hrs, 3-Lots
Results: 0/240
Test: High Temperature Storage Life (HTSL)
Conditions: Ta=175'C, Duration : 1008-Hrs, 3-Lots
Results: 0/240
Test: High Temperature Storage Life (HTSL)
Conditions: Ta=150'C, Duration : 1008-Hrs, 3-Lots
Results: 0/240
Test: Temperature Cycling (TC-PC)
Conditions: Ta=-65'C/150'C, Air-to-Air, Dwell >=10-min, 500-cy, 3-Lots
Results: 0/240
Test: Autoclave Test (AC-PC)
Conditions: Ta=121'C, P=15psi, RH=100%, Duration: 96-Hrs, 6-Lots
Results: 0/480
Test: Highly Accelerated Stress Test (UHAST)
Conditions: Ta=130'C, RH=85%, Duration: 96-Hrs, 3-Lots
Results: 0/240
Issue Date: 12 May 2009
Rev.07-02-06
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