10070D AGILENT TECHNOLOGIES, 10070D Datasheet - Page 16

• Manufacturer Part Number: 10070D
• Description: OSCILLOSCOPE PROBE, 1:1, 20MHZ
• Manufacturer: AGILENT TECHNOLOGIES

Specifications of 10070D

• Test Probe Type: Oscilloscope
• Test Probe Functions: Frequency
• For Use With: Infiniium 8000 Series Oscilloscopes
• Lead Free Status / RoHS Status: na

Infiniium Advanced Application Software
USB 2.0 performance validation and
compliance software (N5416A)
The Infiniium USB 2.0 electrical
performance validation and compliance
option provides a fast and reliable way
to verify USB electrical specification
compliance for USB 2.0 devices, hosts,
and hubs. The Infiniium USB 2.0 test
option executes the official USB-IF
MATLAB scripts with MATLAB’s
runtime engine embedded in the
oscilloscope. Results are displayed in
DDR1 compliance test application
(U7233A)
The Agilent U7231A DDR1 compliance
test application provides you with
a fast and easy way to characterize
and evaluate the electrical and timing
parameters of your DDR1 design. The
tests performed by U7231A are based
on the JEDEC JESD79E DDR SDRAM
Specification.
Vector signal analysis software for
Infiniium (89601A)
The 89601A vector signal
analyzer (VSA) software, used
with the Infiniium 8000 Series,
enables flexible signal analysis
and demodulation up to 1-GHz
bandwidth for troubleshooting
wideband modulated signals
in radar and communications
applications. The solution
provides:
• Flexible demodulation for measuring
16
constellation diagrams, carrier
offset, and frequency error for QPSK
signals, 256-QAM signals and much
more
a flexible report format with margin
analysis. The Infiniium 8000 Series
with bandwidths of 600-MHz and
1 GHz can appropriately test USB
2.0 low- and full-speed buses. The
E2646A SQiDD test fixture is available
for making the physical connection
between the Infiniium oscilloscope and
the device under test.
Features:
• Setup wizard for quick setup and
• Automated measurement and
• Margin analysis to indicate how
• Automatic HTML report generation
• Display formats including
• Error vector magnitude
• Markers to facilitate frequency,
• Time gating that allows you
• Variable frequency resolution
testing
analysis to save you time and effort
close your device comes to passing
or failing the test
for easy documentation
spectrogram, phase vs. time, and
frequency vs. time for rapid insight
into complex signal behavior
measurements (with 89601A Option
AYA)
amplitude, offset, power, phase,
other measurements
to select specific portion of signals
for signal analysis
(continued)