DS2174Q/T&R Maxim Integrated Products, DS2174Q/T&R Datasheet - Page 6
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DS2174Q/T&R
Manufacturer Part Number
DS2174Q/T&R
Description
Communication ICs - Various
Manufacturer
Maxim Integrated Products
Type
Bit Error Rate Testerr
Datasheet
1.DS2174QTR.pdf
(24 pages)
Specifications of DS2174Q/T&R
Mounting Style
SMD/SMT
Operating Supply Voltage
3.3 V
Supply Type
Analog
Package / Case
PLCC-44
Data Rate
622 Mbps
Supply Voltage (max)
3.6 V
Supply Voltage (min)
3 V
Supply Current
50 mA
Maximum Operating Temperature
+ 70 C
Minimum Operating Temperature
0 C
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
1.5 Clock Discussion
There are two methods for moving test patterns through a telecom network.
1) The clock applied to TCLK and RCLK can be gapped by other devices on the target system. The
2) The clock applied to TCLK and RCLK can be continuous at the applicable line rate and the
1.6 Power-Up Sequence
On power-up, the registers in the DS2174 are in a random state. The user must program all the internal
registers to a known state before proper operation can be ensured.
Figure 1-1. Block Diagram
gapped clock would be applied to TCLK and RCLK only during the appropriate times. TDATn
outputs remain active during clock gaps.
TCLK_EN and RCLK_EN pins can be asserted and deasserted during the appropriate time slots.
TDATn outputs remain active even when TCLK_EN is pulled low. The output level remains static at
the level of the last bit transmitted (output high for a 1, output low for a 0).
SYNC
CR1.0
CR1.5
TL
LC
CS RD WR
PARALLEL CONTROL PORT
REPETITIVE PATTERN
GENERATOR
ERROR COUNTER
2
n
BIT COUNTER
- 1
A[3:0]
D[7:0]
PATTERN DETECTOR
6 of 24
ERROR INSERTION
TRANSMIT
CONTROL
CONTROL
RECEIVE
RATE
RATE
RCLK_EN
RCLK
RDAT[7:0]
TCLK_EN
TCLK
TDAT[7:0]
TCLK0