GT10Q301(Q) Toshiba, GT10Q301(Q) Datasheet

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GT10Q301(Q)

Manufacturer Part Number
GT10Q301(Q)
Description
IGBT DUAL 1200V 10A TO-3PN
Manufacturer
Toshiba
Datasheet

Specifications of GT10Q301(Q)

Voltage - Collector Emitter Breakdown (max)
1200V
Vce(on) (max) @ Vge, Ic
2.7V @ 15V, 10A
Current - Collector (ic) (max)
10A
Power - Max
140W
Input Type
Standard
Mounting Type
Through Hole
Package / Case
*
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Igbt Type
-
High Power Switching Applications
Motor Control Applications
Absolute Maximum Ratings
Equivalent Circuit
Third-generation IGBT
Enhancement mode type
High speed: t
Low saturation voltage: V
FRD included between emitter and collector
Collector-emitter voltage
Gate-emitter voltage
Collector current
Emitter-collector
forward current
Collector power dissipation
(Tc = 25°C)
Junction temperature
Storage temperature range
Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the
Gate
significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even
if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum
ratings.
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook
(“Handling Precautions”/Derating Concept and Methods) and individual reliability data (i.e. reliability test report
and estimated failure rate, etc).
Characteristics
f
= 0.32 μs (max)
TOSHIBA Insulated Gate Bipolar Transistor Silicon N Channel IGBT
Collector
Emitter
DC
1 ms
DC
1 ms
CE (sat)
= 2.7 V (max)
(Ta = 25°C)
Symbol
V
V
GT10Q301
T
I
I
P
CES
GES
I
CP
FM
I
T
stg
C
F
C
j
−55 to 150
Rating
1200
±20
140
150
10
20
10
20
1
Marking
GT10Q301
TOSHIBA
Unit
°C
°C
W
V
V
A
A
Weight: 4.6 g (typ.)
Part No. (or abbreviation code)
Lot No.
A line indicates
lead (Pb)-free package or
lead (Pb)-free finish.
JEDEC
JEITA
TOSHIBA
2-16C1C
GT10Q301
2006-10-31
Unit: mm

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GT10Q301(Q) Summary of contents

Page 1

... Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook (“Handling Precautions”/Derating Concept and Methods) and individual reliability data (i.e. reliability test report and estimated failure rate, etc). ...

Page 2

Electrical Characteristics Characteristics Gate leakage current Collector cut-off current Gate-emitter cut-off voltage Collector-emitter saturation voltage Input capacitance Rise time Turn-on time Switching time Fall time Turn-off time Peak forward voltage Reverse recovery time Thermal resistance (IGBT) Thermal resistance (diode) Note: ...

Page 3

I – Common emitter Tc = 25° Collector-emitter voltage V ( – ...

Page 4

Switching Time – 0 0.05 Common emitter 0. 600 ± ...

Page 5

C – 3000 1000 300 100 30 10 Common emitter MHz Tc = 25°C 1 0.1 0 100 Collector-emitter voltage – ...

Page 6

Tc = 25° Diode stage 0 10 IGBT stage −1 10 −2 10 −3 10 −4 10 −5 −4 −3 −2 − Pulse ...

Page 7

... The information contained herein is presented only as a guide for the applications of our products. No responsibility is assumed by TOSHIBA for any infringements of patents or other rights of the third parties which may result from its use. No license is granted by implication or otherwise under any patents or other rights of TOSHIBA or the third parties. • ...

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