MUR180ERLG ON Semiconductor, MUR180ERLG Datasheet
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MUR180ERLG
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MUR180ERLG Summary of contents
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... Recommended Operating Conditions may affect device reliability. 1. Pulse Test: Pulse Width = 300 ms, Duty Cycle ≤ 2.0%. *For additional information on our Pb−Free strategy and soldering details, please download the ON Semiconductor Soldering and Mounting Techniques Reference Manual, SOLDERRM/D. © Semiconductor Components Industries, LLC, 2006 July, 2006 − ...
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... Pulse Test: Pulse Width = 300 ms, Duty Cycle ≤ 2.0%. ORDERING INFORMATION Device MUR180E MUR180EG MUR180ERL MUR180ERLG MUR1100E MUR1100EG MUR1100ERL MUR1100ERLG †For information on tape and reel specifications, including part orientation and tape sizes, please refer to our Tape and Reel Packaging Specifications Brochure, BRD8011/D. ...
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T = 175°C 25°C J 2.0 100°C 1.0 0.7 0.5 0.3 0.2 0.1 0.07 0.05 0.03 0.02 0.01 0.3 0.5 0.7 0.9 1.1 1.3 1.5 v INSTANTANEOUS VOLTAGE (VOLTS) F, Figure 1. Typical Forward Voltage ...
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COIL MERCURY SWITCH DUT S 1 Figure 6. Test Circuit The unclamped inductive switching circuit shown in Figure 6 was used to demonstrate the controlled avalanche capability of the new “E’’ series ...
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MUR180E, MUR1100E NOTE 3 — AMBIENT MOUNTING DATA Data shown for thermal resistance, junction−to−ambient (R ) for the mountings shown used as typical qJA guideline values for preliminary engineering or in case the tie point temperature cannot ...
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... Opportunity/Affirmative Action Employer. This literature is subject to all applicable copyright laws and is not for resale in any manner. PUBLICATION ORDERING INFORMATION LITERATURE FULFILLMENT: Literature Distribution Center for ON Semiconductor P.O. Box 5163, Denver, Colorado 80217 USA Phone: 303−675−2175 or 800−344−3860 Toll Free USA/Canada Fax: 303− ...