ADM211EARU-REEL Analog Devices Inc, ADM211EARU-REEL Datasheet - Page 14
![no-image](/images/manufacturer_photos/0/0/57/analog_devices_inc_sml.jpg)
ADM211EARU-REEL
Manufacturer Part Number
ADM211EARU-REEL
Description
IC,LINE TRANSCEIVER,CMOS,4 DRIVER,5 RCVR,TSSOP,28PIN,PLASTIC
Manufacturer
Analog Devices Inc
Type
Transceiverr
Datasheet
1.ADM213EARSZ-REEL.pdf
(20 pages)
Specifications of ADM211EARU-REEL
Rohs Status
RoHS non-compliant
Number Of Drivers/receivers
4/5
Protocol
RS232
Voltage - Supply
4.5 V ~ 5.5 V
Mounting Type
Surface Mount
Package / Case
28-TSSOP
Lead Free Status / RoHS Status
ADM206E/ADM207E/ADM208E/ADM211E/ADM213E
Table 10. Test Severity Levels (IEC 1000-4-3)
Level
1
2
3
EMISSIONS/INTERFERENCE
EN 55022, CISPR 22 defines the permitted limits of radiated
and conducted interference from information technology (IT)
equipment. The objective of the standard is to minimize the
level of emissions, both conducted and radiated.
For ease of measurement and analysis, conducted emissions are
assumed to predominate below 30 MHz, and radiated emissions
are assumed to predominate above 30 MHz.
CONDUCTED EMISSIONS
This is a measure of noise that is conducted onto the line power
supply. Switching transients from the charge pump that are 20 V
in magnitude and that contain significant energy can lead to
conducted emissions. Another source of conducted emissions is
the overlap in switch-on times in the charge pump voltage
converter. In the voltage doubler shown in Figure 31, if S2 has
not fully turned off before S4 turns on, a transient current glitch
occurs between V
sions. Therefore, it is important that the switches in the charge
pump guarantee break-before-make switching under all condi-
tions so instantaneous short-circuit conditions do not occur.
The ADM2xxE have been designed to minimize the switching
transients and ensure break-before-make switching, thereby
minimizing conducted emissions. This results in emission
levels well below specified limits. Other than the recom-
mended 0.1 μF capacitor, no additional filtering/decoupling
is required.
Conducted emissions are measured by monitoring the line
power supply. The equipment used consists of a line impedance
stabilizing network (LISN) that essentially presents a fixed
impedance at RF and a spectrum analyzer. The spectrum
analyzer scans for emissions up to 30 MHz. A plot for the
ADM211E is shown in Figure 33.
OSCILLATOR
GND
INTERNAL
V
CC
Figure 31. Charge Pump Voltage Doubler
S1
S2
CC
and GND that results in conducted emis-
C1
+
Field Strength (V/m)
1
3
10
S3
S4
C3
+
V+ = 2V
V
CC
CC
Rev. E | Page 14 of 20
RADIATED EMISSIONS
Radiated emissions are measured at frequencies in excess of
30 MHz. RS-232 outputs designed for operation at high baud
rates while driving cables can radiate high frequency EM
energy. The previously described causes of conducted emissions
can also cause radiated emissions. Fast RS-232 output tran-
sitions can radiate interference, especially when lightly loaded
and driving unshielded cables. Charge pump devices are also
prone to radiating noise due to the high frequency oscillator
and the high voltages being switched by the charge pump. The
move toward smaller capacitors in order to conserve board
space has resulted in higher frequency oscillators being em-
ployed in the charge pump design, resulting in higher levels of
conducted and radiated emissions.
The RS-232 outputs on the ADM2xxE products feature a con-
trolled slew rate in order to minimize the level of radiated
emissions, yet they are fast enough to support data rates of up to
230 kbps.
80
70
60
50
40
30
20
10
0
ø1
ø2
SWITCHING GLITCHES
0.33
Figure 33. Conducted Emissions Plot
0.6
Figure 32. Switching Glitches
LOG FREQUENCY (MHz)
1
3
6
18
30
LIMIT