ADIS16334BMLZ Analog Devices Inc, ADIS16334BMLZ Datasheet - Page 4

• Manufacturer Part Number: ADIS16334BMLZ
• Description: Low Profile IMU
• Manufacturer: Analog Devices Inc
• Series: iMEMS®, iSensor™r

Specifications of ADIS16334BMLZ

• Output Type: Digital - SPI
• Sensor Type: Accelerometer, Gyroscope, 3 Axis
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant

ADIS16334
Parameter
LOGIC INPUTS
DIGITAL OUTPUTS
FLASH MEMORY
FUNCTIONAL TIMES
CONVERSION RATE
POWER SUPPLY
1
2
3
4
5
The digital I/O signals are driven by an internal 3.3 V supply, and the inputs are 5 V tolerant.
Endurance is qualified as per JEDEC Standard 22, Method A117, and measured at −40°C, +25°C, +85°C, and +125°C.
The data retention lifetime equivalent is at a junction temperature (T
temperature.
These times do not include thermal settling and internal filter response times (330 Hz bandwidth), which may affect overall accuracy.
The sync input clock functions below the specified minimum value, at reduced performance levels.
Input High Voltage, V
Input Low Voltage, V
CS Wake-Up Pulse Width
Logic 1 Input Current, I
Logic 0 Input Current, I
Input Capacitance, C
Output High Voltage, V
Output Low Voltage, V
Data Retention
Power-On Start-Up Time
Reset Recovery Time
Flash Memory Test Time
Self-Test Time
Internal Sample Rate
Tolerance
Sync Input Clock
Supply Voltage
Power Supply Current
All Pins Except RST
RST Pin
1
3
1
5
4
IL
IN
IH
OL
IH
IL
OH
Test Conditions/Comments
CS signal to wake up from sleep mode
V
V
I
I
Endurance
T
Time until data is available
SMPL_PRD = 0x0000
Normal mode
Normal mode
Normal mode
SMPL_PRD = 0x0001
SMPL_PRD = 0x0001
SOURCE
SINK
J
IH
IL
= 85°C
= 0 V
= 3.3 V
= 1.6 mA
= 1.6 mA
2
J
) of 85°C as per JEDEC Standard 22, Method A117. Data retention lifetime decreases with junction
Rev. 0 | Page 4 of 20
Min
2.0
20
2.4
10,000
20
0.8
4.75
Typ
±0.2
40
1
10
180
60
20
14
819.2
5.0
47
Max
0.8
0.55
±10
60
0.4
±3
1.2
5.25
Unit
V
V
V
μs
μA
μA
mA
pF
V
V
Cycles
Years
ms
ms
ms
ms
SPS
%
kHz
V
mA