SIOV-B40K275 EPCOS Inc, SIOV-B40K275 Datasheet - Page 8

• Manufacturer Part Number: SIOV-B40K275
• Manufacturer: EPCOS Inc

Specifications of SIOV-B40K275

• Technology: Metal Oxide
• Capacitance Value: 2700pF
• Clamping Current: 300A
• Clamping Voltage: 710V
• Lead Style: Screw
• Ac Voltage Rating (max): 275VAC
• Dc Voltage Rating (max): 350VDC
• Operating Temp Range: -40C to 85C
• Mounting: Bolt-Down
• Surge Current (max): 40000A
• Lead Spacing: 24mm
• Product Length (mm): 60mm
• Product Depth (mm): 14mm
• Product Height (mm): 55mm
• Varistor Voltage: 430V
• Lead Free Status / RoHS Status: Compliant

Reliability data
Test
Varistor voltage
Clamping voltage
Max. DC operating voltage The maximum allowable DC operating
Surge current derating,
8/20 µs
Fast temperature cycling
Damp heat, steady state
Note:
UCT = Upper category temperature
LCT = Lower category temperature
Please read Cautions and warnings and
Important notes at the end of this document.
Block varistors
HighE series
Test methods/conditions
The voltage between two terminals with
the specified measuring current applied
is called V
The maximum voltage between two
terminals with the specified standard
impulse current (8/20 µs) applied.
voltage V
applied for 1000 ±48 h.
The leakage current I
is recorded.
Then the specimen shall be stored at
room temperature and normal humidity
for 1 to 2 h.
Thereafter, the change of V
measured.
10 surge currents (8/20 µs), unipolar,
interval ≥60 s, amplitude correspond-
ing to derating curve for 10 impulses
at 20 µs
IEC 60068-2-14, test Na, LCT/UCT,
dwell time 120 min, 5 cycles
IEC 60068-2-78
The specimen shall be subjected to
40 ±2 °C, 90 to 95% r. H. for 56 ±2 days
with 10% of the maximum continuous
DC operating voltage V
Then stored at room temperature and
normal humidity for 1 to 2 h.
Thereafter, the change of V
measured.
DC
v
(1 mA
at UCT +5/–0 °C is
DC
8
@ 0.2 … 2 s).
leak
DC
11/07
(t) during test
.
v
v
shall be
shall be
Requirement
To meet the specified value.
To meet the specified value.
I
|
|
(measured in direction
of surge current)
No visible damage
|
No visible damage
|
leak
∆V/V (1 mA)
∆V/V (1 mA)
∆V/V (1 mA)
∆V/V (1 mA)
(t = 1000 h) ≤ I
|
|
|
|
≤10%
≤10%
≤10%
≤10%
leak
(t = 0 h)