81150A-002 AGILENT TECHNOLOGIES, 81150A-002 Datasheet - Page 11

NOISE GENERATOR, ARB/FREQ/PULSE, 120MHZ

81150A-002

Manufacturer Part Number
81150A-002
Description
NOISE GENERATOR, ARB/FREQ/PULSE, 120MHZ
Manufacturer
AGILENT TECHNOLOGIES
Datasheet

Specifications of 81150A-002

Signal Generator Type
Pulse
Bandwidth
120MHz
Modulation Type
Amplitude/Frequency/Phase/Pulse
Supply Voltage Range
100V To 240V
External Height
108mm
External Width
439mm
Lead Free Status / RoHS Status
na
Software upgrade to 81150A
and 81160A
PRBS
3-level signals
Bit and block trigger mode
Pass through pattern for combined
physical and protocol test
up to 10 Mbit/s
Sequencer
Emulate effects like...
• Capacitive load of the channel
• Asymmetric delay
• Crossing point deviations
• Duty cycle distortions
• Arbitrary transition times
• Level noise
• Delays from/to electrical idle
...By defi ning the transitions so that the
previous bit infl uences the current bit
Stress your device to its limits–defi ne your own bit shape
The 81150A and the 81160A pattern generators let you defi ne the transitions from one bit
to the other so that the previous bit infl uences the current bit. The user can set up own
defi ned arbitrary bit shapes.
In addition to user-defi ned patterns, standard patterns like PRBS up to 2
The sequencer allows setting up a pre-amble sequence so that the device under test
moves into test mode.
With the 3-level signals it is no longer necessary to add different signals for electrical idle.
Up to 4 levels are available in the expert mode.
Besides, standard trigger modes like continuous bit and block trigger modes allow adop-
tions to application needs. In the bit mode you see that on every trigger, the sequence
is advanced by one bit. An application example is a bit clock, which can be fed into an
external clock and then into the trigger input.
In the block mode the entire data block is generated once per trigger event. This is
interesting for example in applications with protocol data.
The 81150A and the 81160A pattern generators pass the data through to the device
under test and adopts it to any kind of stress test (shape and timing change).
Bridge the gap between protocol and physical layer test – in real time up to 10 Mbit/s
Increase your test efficiency by combining physical layer test with protocol test
The pass-through pattern functionality takes the protocol data via “mod in” and adopts it
to any kind of stress test (shape and timing changes).
Arbitrary
Bit shape
Mode
NRZ
Mode
Sends out protocol
data; e.g. VPT 1000
for FlexRay
exerciser
Protocol
NRZ mode with minimum
transition times
Bit shape waveforms
(user defined)
Output waveform
NRZ mode with minimum
transition times
NRZ mode with transition
time = 1/3 period
Data pattern: 01001101
MOD
IN
11
Protocol handshake
81150A/81160A
Real-time data pass
through with flexible
modulation and
re-stress test
pass through
pattern
0→0
Transition
time
0→1
1→0 1→1
Pass/fail test
DUT
Period
Max voltage level
Min voltage level
Max voltage level
Min voltage level
Max voltage level
Min voltage level
31
are available.