SST25VF016B-75-4I-QAF SILICON STORAGE TECHNOLOGY, SST25VF016B-75-4I-QAF Datasheet - Page 27
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SST25VF016B-75-4I-QAF
Manufacturer Part Number
SST25VF016B-75-4I-QAF
Description
MEMORY, FLASH, 16MBIT, SPI, 8WSON
Manufacturer
SILICON STORAGE TECHNOLOGY
Datasheet
1.SST25VF016B-50-4I-QAF.pdf
(31 pages)
Specifications of SST25VF016B-75-4I-QAF
Memory Size
16Mbit
Clock Frequency
75MHz
Supply Voltage Range
2.7V To 3.6V
Memory Case Style
WSON
No. Of Pins
8
Operating Temperature Range
-40°C To +85°C
Svhc
No SVHC (18-Jun-2010)
Memory Type
Flash
Memory Configuration
2M X 8
Interface Type
Serial, SPI
Rohs Compliant
Yes
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Available stocks
Company
Part Number
Manufacturer
Quantity
Price
Company:
Part Number:
SST25VF016B-75-4I-QAF
Manufacturer:
ALTERA
Quantity:
430
A Microchip Technology Company
©2011 Silicon Storage Technology, Inc.
Figure 26:AC Input/Output Reference Waveforms
Figure 27:A Test Load Example
AC test inputs are driven at V
surement reference points for inputs and outputs are V
and fall times (10%
V IHT
V ILT
INPUT
↔
TO DUT
90%) are <5 ns.
IHT
V HT
V LT
(0.9V
27
DD
REFERENCE POINTS
) for a logic “1” and V
TO TESTER
16 Mbit SPI Serial Flash
HT
(0.6V
V HT
V LT
ILT
DD
1271 TstLd.0
C
(0.1V
) and V
L
Note: V
DD
LT
SST25VF016B
) for a logic “0”. Mea-
V
V
V
OUTPUT
LT
IHT
ILT
HT
(0.4V
- V
- V
- V
- V
LOW
HIGH
INPUT
INPUT
DD
S71271-04-000
1271 IORef.0
Test
). Input rise
Test
LOW Test
HIGH Test
Data Sheet
01/11