GNM0M2R60E105ME17D Murata Electronics North America, GNM0M2R60E105ME17D Datasheet - Page 125
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GNM0M2R60E105ME17D
Manufacturer Part Number
GNM0M2R60E105ME17D
Description
CAP 2-ARRAY 1.0UF 2.5V X5R SMD
Manufacturer
Murata Electronics North America
Datasheet
1.GNM1M2R71C104MA03D.pdf
(220 pages)
Specifications of GNM0M2R60E105ME17D
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Available stocks
Company
Part Number
Manufacturer
Quantity
Price
Company:
Part Number:
GNM0M2R60E105ME17D
Manufacturer:
HALO
Quantity:
30 000
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!Note
• This PDF catalog is downloaded from the website of Murata Manufacturing co., ltd. Therefore, it’s specifications are subject to change or our products in it may be discontinued without advance notice. Please check with our
• This PDF catalog has only typical specifications because there is no space for detailed specifications. Therefore, please approve our product specifications or transact the approval sheet for product specifications before ordering.
sales representatives or product engineers before ordering.
!Note
Mounting for testing: The capacitors should be mounted on the substrate as shown below using die bonding and wire bonding when tests No.11 to 15 are performed.
No.
10
11
12
GMA Series Specifications and Test Methods (1)
1
2
3
4
5
6
7
8
9
Capacitance
Temperature
Characteristics
Vibration
Resistance
Temperature
Cycle
Operating
Temperature
Range
Rated Voltage
Appearance
Dimensions
Dielectric Strength
Insulation Resistance
Capacitance
Dissipation Factor
(D.F.)
Mechanical
Strength
• Please read rating and !CAUTION (for storage, operating, rating, soldering, mounting and handling) in this catalog to prevent smoking and/or burning, etc.
• This catalog has only typical specifications because there is no space for detailed specifications. Therefore, please approve our product specifications or transact the approval sheet for product specifications before ordering.
Item
No bias
Bond
Strength
Die Shear
Strength
Appearance
Capacitance
D.F.
Appearance
Capacitance
Change
D.F.
I.R.
Dielectric
Strength
R7: Y55 to W125D
See the previous pages.
No defects or abnormalities
Within the specified dimensions
No defects or abnormalities
More than 10,000MΩ or 500ΩF
(Whichever is smaller)
Within the specified tolerance
R7: W.V.: 25V min.; 0.025 max.
R7:
R7: Within W/–15% (–55 to W125°C)
Pull force: 0.03N min.
Die Shear force: 2N min.
No defects or abnormalities
Within the specified tolerance
R7: W.V.: 25V min.; 0.025 max.
R7:
No defects or abnormalities
R7: Within T7.5%
R7: W.V.: 25V min.; 0.025 max.
R7:
More than 10,000MΩ or 500Ω F
(Whichever is smaller)
No defects
W.V.: 16V/10V; 0.035 max.
W.V.: 16V/10V; 0.035 max.
W.V.: 16V/10V; 0.035 max.
In case Non "*" is added in PNs table, please refer to GMA Series Specifications and Test Methods (1).
Specifications
In case "*" is added in PNs table, please refer to GMA Series Specifications and Test Methods (2).
GMA Series Specifications and Test Methods(1)
Reference Temperature: 25D
The rated voltage is defined as the maximum voltage which
may be applied continuously to the capacitor.
When AC voltage is superimposed on DC voltage, V
whichever is larger, should be maintained within the rated voltage
range.
Visual inspection
Using calipers
No failure should be observed when a voltage of 250% of the
rated voltage is applied between the both terminations for 1 to 5
seconds, provided the charge/discharge current is less than
50mA.
The insulation resistance should be measured with a DC
voltage not exceeding the rated voltage at normal temperature
and humidity and within 2 minutes of charging.
The capacitance/D.F. should be measured at reference
temperature at the frequency and voltage shown in the table.
The capacitance change should be measured after 5min. at
each specified temp. stage.
#The ranges of capacitance change compared with the
Reference Temperature value over the temperature ranges
shown in the table should be within the specified ranges.
*Initial measurement for high dielectric constant type
Perform a heat treatment at 150 W0/Y10°C for one hour and
then let sit for 24T2 hours at room temperature.
Perform the initial measurement.
MIL-STD-883 Method 2011 Condition D
Mount the capacitor on a gold metallized alumina substrate with
Au-Sn (80/20) and bond a 25 m (0.001 inch) gold wire to the
capacitor terminal using an ultrasonic ball bond. Then, pull wire.
MIL-STD-883 Method 2019
Mount the capacitor on a gold metallized alumina substrate
with Au-Sn (80/20). Apply the force parallel to the substrate.
Ramp frequency from 10 to 55Hz then return to 10Hz all within
1 minute. Amplitude: 1.5 mm (0.06 inch) max. total excursion.
Apply this motion for a period of 2 hours in each of 3 mutually
perpendicular directions (total 6 hours).
The capacitor should be set for 24T2 hours at room
temperature after one hour heat of treatment at 150W0/Y10D,
then measure for the initial measurement. Fix the capacitor to
the supporting jig in the same manner and under the same
conditions as (11) and conduct the five cycles according to the
temperatures and time shown in the following table. Set it for
24T2 hours at room temperature, then measure.
Temp. (D)
Time (min.)
Frequency
Voltage
Step
Step
1
2
3
4
Min. Operating
Temp. W0/Y3
30T3
1
Test Method
Temperature (°C)
Temp.
Room
2 to 3
Continued on the following page.
2
–55T3
125T3
25T2
25T2
1T0.1kHz
1T0.2Vrms
Max. Operating
Temp. W3/Y0
30T3
3
P-P
Temp.
Room
2 to 3
or V
4
*
O-P
123
,
C02E.pdf
09.9.18
7
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