B72232B0131K001 EPCOS Inc, B72232B0131K001 Datasheet - Page 8
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B72232B0131K001
Manufacturer Part Number
B72232B0131K001
Description
Varistors 130V RMS 32MM Varistor B32K130
Manufacturer
EPCOS Inc
Datasheet
1.B32K550.pdf
(20 pages)
Specifications of B72232B0131K001
Voltage Rating Dc
170 V
Voltage Rating Ac
130 V
Clamping Voltage
340 V
Peak Surge Current
25000 A
Surge Energy Rating
210 J
Capacitance
4400 pF
Operating Temperature Range
- 40 C to + 85 C
Mounting
SMD/SMT
Dimensions
32 mm Dia. x 55 mm L
Tolerance
10 %
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Reliability data
Test
Varistor voltage
Clamping voltage
Max. DC operating voltage The maximum allowable DC operating
Surge current derating,
8/20 µs
Fast temperature cycling
Damp heat, steady state
Note:
UCT = Upper category temperature
LCT = Lower category temperature
Please read Cautions and warnings and
Important notes at the end of this document.
Block varistors
HighE series
Test methods/conditions
The voltage between two terminals with
the specified measuring current applied
is called V
The maximum voltage between two
terminals with the specified standard
impulse current (8/20 µs) applied.
voltage V
applied for 1000 ±48 h.
The leakage current I
is recorded.
Then the specimen shall be stored at
room temperature and normal humidity
for 1 to 2 h.
Thereafter, the change of V
measured.
10 surge currents (8/20 µs), unipolar,
interval ≥60 s, amplitude correspond-
ing to derating curve for 10 impulses
at 20 µs
IEC 60068-2-14, test Na, LCT/UCT,
dwell time 120 min, 5 cycles
IEC 60068-2-78
The specimen shall be subjected to
40 ±2 °C, 90 to 95% r. H. for 56 ±2 days
with 10% of the maximum continuous
DC operating voltage V
Then stored at room temperature and
normal humidity for 1 to 2 h.
Thereafter, the change of V
measured.
DC
v
(1 mA
at UCT +5/–0 °C is
DC
8
@ 0.2 … 2 s).
leak
DC
11/07
(t) during test
.
v
v
shall be
shall be
Requirement
To meet the specified value.
To meet the specified value.
I
|
|
(measured in direction
of surge current)
No visible damage
|
No visible damage
|
leak
∆V/V (1 mA)
∆V/V (1 mA)
∆V/V (1 mA)
∆V/V (1 mA)
(t = 1000 h) ≤ I
|
|
|
|
≤10%
≤10%
≤10%
≤10%
leak
(t = 0 h)