AP-SAFD18BQA016GS-EML Apacer, AP-SAFD18BQA016GS-EML Datasheet - Page 25

• Manufacturer Part Number: AP-SAFD18BQA016GS-EML
• Description: Memory Modules SAFD 181-M 16GB
• Manufacturer: Apacer

Specifications of AP-SAFD18BQA016GS-EML

• Product: 1.8 in Solid State Drive
• Operating Supply Voltage: 3.3 V
• Maximum Operating Temperature: + 70 C
• Minimum Operating Temperature: 0 C
• Memory Size: 16 GB
• Memory Type: SATA Flash Drive
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant

3. Flash Management
3.1
The SAFD181 series implements a hardware ECC scheme, based on the BCH algorithm, to achieve up to
8/15 bit correction per 512 bytes.
3.2
Although bad blocks on the flash media are already identified by the flash manufacturer, they can also be
accumulated over time during operation. The controller of SAFD181 series maintains a table that lists those
normal blocks with disk data, the free blocks for wear leveling, and bad blocks with errors. When a normal
block is detected broken, it is replaced with a free block and listed as a bad block. When a free block is
detected broken, it is then removed from the free block list and marked as a bad block.
During device operation, this ensures that newly accumulated bad blocks are transparent to the host. The
device will stop file write service once there are only two free blocks left such that the read function is still
available for copying the files from the disk into another.
3.3
The NAND flash devices are limited by a certain number of write cycles. When using a FAT-based file system,
frequent FAT table updates are required. If some area on the flash wears out faster than others, it would
significantly reduce the lifetime of the whole SSD, even if the erase counts of others are far from the write
cycle limit. Thus, if the write cycles can be distributed evenly across the media, the lifetime of the media can
be prolonged significantly. This scheme is called wear leveling.
Apacer’s wear-leveling scheme is achieved both via buffer management and Apacer-specific global wear
leveling. They both ensure that the lifetime of the flash media can be increased, and the disk access
performance is optimized as well.
3.4
The Low Power Detection on the controller initiates cached data saving before the power supply to the device
is too low. This feature prevents the device from crash and ensures data integrity during an unexpected
blackout. Once power was failure before cached data writing back into flash, data in the cache will lost. The
next time the power is on, the controller will check these fragmented data segment, and, if necessary, replace
them with old data kept in flash until programmed successfully.
3.5
Accomplished by the Secure Erase (SE) command, which added to the open ANSI standards that control disk
drives, “Quick Erase” is built into the disk drive itself and thus far less susceptible to malicious software attacks
than external software utilities. It is a positive easy-to-use data destroy command, amounting to electronic
data shredding. Executing the command causes a drive to internally completely erase all possible user data.
This command is carried out within disk drives, so no additional software is required. Once executed, neither
data nor the erase counter on the device would be recoverable, which blurs the accuracy of device lifespan.
© 2010 Apacer Technology Inc.
Error Correction/Detection
Bad Block Management
Wear Leveling
Power Failure Management
Quick Erase
AP-SAFD18BQAxxxxS-EML
Serial ATA Flash Drive
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Rev. 1.4