2SA1162GRT5LFT Toshiba, 2SA1162GRT5LFT Datasheet

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2SA1162GRT5LFT

Manufacturer Part Number
2SA1162GRT5LFT
Description
Bipolar Small Signal Transistor
Manufacturer
Toshiba
Datasheet

Specifications of 2SA1162GRT5LFT

Dc Collector/base Gain Hfe Min
200
Transistor Polarity
PNP
Mounting Style
SMD/SMT
Package / Case
S-Mini
Emitter- Base Voltage Vebo
- 5 V
Continuous Collector Current
- 150 mA
Power Dissipation
150 mW
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Audio Frequency General Purpose Amplifier Applications
• High voltage and high current:
• Excellent h
• High h
• Low noise: NF = 1dB (typ.), 10dB (max)
• Complementary to 2SC2712
• Small package
Absolute Maximum Ratings
Electrical Characteristics
Marking
Collector-base voltage
Collector-emitter voltage
Emitter-base voltage
Collector current
Base current
Collector power dissipation
Junction temperature
Storage temperature range
Note: Using continuously under heavy loads (e.g. the application of high
Collector cut-off current
Emitter cut-off current
DC current gain
Collector-emitter saturation voltage
Transition frequency
Collector output capacitance
Noise figure
Note: h
FE:
temperature/current/voltage and the significant change in
temperature, etc.) may cause this product to decrease in the
reliability significantly even if the operating conditions (i.e.
operating temperature/current/voltage, etc.) are within the
absolute maximum ratings.
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook
(“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test
report and estimated failure rate, etc).
FE
h
Characteristics
Characteristics
FE
FE
classification O (O): 70~140, Y (Y): 120~240, GR (G): 200~400, ( ) marking symbol
linearity: h
= 70~400
TOSHIBA Transistor Silicon PNP Epitaxial Type (PCT process)
FE
= 0.95 (typ.)
(I
C
= −0.1 mA)/h
(Ta = 25°C)
V
CEO
(Ta = 25°C)
V
Symbol
Symbol
V
V
V
CE (sat)
I
I
T
CBO
EBO
h
C
= −50 V, I
P
NF
CBO
CEO
EBO
I
I
T
f
stg
FE
C
B
T
ob
C
2SA1162
j
(Note)
FE
V
V
V
I
V
V
V
Rg = 10 kΩ,
(I
C
C
CB
EB
CE
CE
CB
CE
C
= −100 mA, I
−55~125
= −150 mA (max)
= −2 mA)
Rating
= −50 V, I
= −5 V, I
= −6 V, I
= −10 V, I
= −10 V, I
= −6 V, I
−150
−50
−50
−30
150
125
−5
1
Test Condition
C
C
C
E
C
E
= 0
= −2 mA
= −0.1 mA, f = 1 kHz,
B
= 0
= 0, f = 1 MHz
= −1 mA
= −10 mA
Unit
mW
mA
mA
°C
°C
V
V
V
Weight: 0.012 g (typ.)
JEDEC
JEITA
TOSHIBA
Min
70
80
Typ.
−0.1
1.0
4
TO-236MOD
2-3F1A
SC-59
2007-11-01
−0.1
−0.1
−0.3
2SA1162
Max
400
10
7
Unit: mm
MHz
Unit
μA
μA
pF
dB
V

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2SA1162GRT5LFT Summary of contents

Page 1

... Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook (“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test report and estimated failure rate, etc). ...

Page 2

2 2SA1162 2007-11-01 ...

Page 3

... Product shall not be used for or incorporated into any products or systems whose manufacture, use, or sale is prohibited under any applicable laws or regulations. • The information contained herein is presented only as guidance for Product use. No responsibility is assumed by TOSHIBA for any infringement of patents or any other intellectual property rights of third parties that may result from the use of Product. No license to any intellectual property right is granted by this document, whether express or implied, by estoppel or otherwise. • ...

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