MC9S08AC32CPUE Freescale Semiconductor, MC9S08AC32CPUE Datasheet - Page 327

• Manufacturer Part Number: MC9S08AC32CPUE
• Description: IC MCU 8BIT 32K FLASH 64-LQFP
• Manufacturer: Freescale Semiconductor
• Series: HCS08r

Specifications of MC9S08AC32CPUE

• Core Processor: HCS08
• Core Size: 8-Bit
• Speed: 40MHz
• Connectivity: I²C, SCI, SPI
• Peripherals: LVD, POR, PWM, WDT
• Number Of I /o: 54
• Program Memory Size: 32KB (32K x 8)
• Program Memory Type: FLASH
• Ram Size: 2K x 8
• Voltage - Supply (vcc/vdd): 2.7 V ~ 5.5 V
• Data Converters: A/D 16x10b
• Oscillator Type: Internal
• Operating Temperature: -40°C ~ 85°C
• Package / Case: 64-LQFP
• Processor Series: S08AC
• Core: HCS08
• Data Bus Width: 8 bit
• Data Ram Size: 2 KB
• Interface Type: I2C, SCI, SPI
• Maximum Clock Frequency: 20 MHz
• Number Of Programmable I/os: 54
• Number Of Timers: 3
• Maximum Operating Temperature: + 85 C
• Mounting Style: SMD/SMT
• 3rd Party Development Tools: EWS08
• Development Tools By Supplier: DEMO9S08AC60E, DEMOACEX, DEMOACKIT, DCF51AC256, DC9S08AC128, DC9S08AC16, DC9S08AC60, DEMO51AC256KIT
• Minimum Operating Temperature: - 40 C
• On-chip Adc: 10 bit, 16 Channel
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant
• Eeprom Size: -
• Lead Free Status / Rohs Status: Lead free / RoHS Compliant

A.13 EMC Performance
Electromagnetic compatibility (EMC) performance is highly dependant on the environment in which the
MCU resides. Board design and layout, circuit topology choices, location and characteristics of external
components as well as MCU software operation all play a significant role in EMC performance. The
system designer should consult Freescale applications notes such as AN2321, AN1050, AN1263,
AN2764, and AN1259 for advice and guidance specifically targeted at optimizing EMC performance.
A.13.1
Microcontroller transient conducted susceptibility is measured in accordance with an internal Freescale
test method. The measurement is performed with the microcontroller installed on a custom EMC
evaluation board and running specialized EMC test software designed in compliance with the test method.
The conducted susceptibility is determined by injecting the transient susceptibility signal on each pin of
the microcontroller. The transient waveform and injection methodology is based on IEC 61000-4-4
(EFT/B). The transient voltage required to cause performance degradation on any pin in the tested
configuration is greater than or equal to the reported levels unless otherwise indicated by footnotes below
the table.
1
2
The susceptibility performance classification is described in
Freescale Semiconductor
Conducted susceptibility, electrical
fast transient/burst (EFT/B)
Data based on qualification test results. Not tested in production.
The RESET pin is susceptible to the minimum applied transient of 220V. However, adding the recommended 0.1μF decoupling
capacitor should prevent failures below the minimum amplitude.
Result
A
B
C
Parameter
Conducted Transient Susceptibility
Self-recovering
Soft failure
No failure
failure
Table A-17. Susceptibility Performance Classification
Table A-16. Conducted Transient Susceptibility
The MCU performs as designed during and after exposure.
The MCU does not perform as designed during exposure. The MCU returns
automatically to normal operation after exposure is removed.
The MCU does not perform as designed during exposure. The MCU does not return to
normal operation until exposure is removed and the RESET pin is asserted.
MC9S08AC60 Series Data Sheet, Rev. 2
V
Symbol
CS_EFT
package type
Conditions
V
T
A
DD
64 QFP
= +25
= 5.0V
Performance Criteria
Appendix A Electrical Characteristics and Timing Specifications
o
C
Table
32.768kHz
2MHz Bus
f
OSC
crystal
/f
A-17.
BUS
Result
A
B
C
D
Amplitude
± 2.8
(Min)
± 2.8
± 2.8
± 3.8
2
1
Unit
kV
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