B40K385 EPCOS Inc, B40K385 Datasheet - Page 8
B40K385
Manufacturer Part Number
B40K385
Description
VARISTOR BLOCK 385VRMS 40MM
Manufacturer
EPCOS Inc
Series
HighEr
Datasheet
1.B32K550.pdf
(20 pages)
Specifications of B40K385
Varistor Voltage
620V
Current-surge
40kA
Number Of Circuits
1
Maximum Ac Volts
385VAC
Maximum Dc Volts
505VDC
Energy
800J
Package / Case
Chassis Mount
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Other names
B72240B 381K 1
B72240B0381K001
B72240B381K1
B72240B0381K001
B72240B381K1
Available stocks
Company
Part Number
Manufacturer
Quantity
Price
Reliability data
Test
Varistor voltage
Clamping voltage
Max. DC operating voltage The maximum allowable DC operating
Surge current derating,
8/20 µs
Fast temperature cycling
Damp heat, steady state
Note:
UCT = Upper category temperature
LCT = Lower category temperature
Please read Cautions and warnings and
Important notes at the end of this document.
Block varistors
HighE series
Test methods/conditions
The voltage between two terminals with
the specified measuring current applied
is called V
The maximum voltage between two
terminals with the specified standard
impulse current (8/20 µs) applied.
voltage V
applied for 1000 ±48 h.
The leakage current I
is recorded.
Then the specimen shall be stored at
room temperature and normal humidity
for 1 to 2 h.
Thereafter, the change of V
measured.
10 surge currents (8/20 µs), unipolar,
interval ≥60 s, amplitude correspond-
ing to derating curve for 10 impulses
at 20 µs
IEC 60068-2-14, test Na, LCT/UCT,
dwell time 120 min, 5 cycles
IEC 60068-2-78
The specimen shall be subjected to
40 ±2 °C, 90 to 95% r. H. for 56 ±2 days
with 10% of the maximum continuous
DC operating voltage V
Then stored at room temperature and
normal humidity for 1 to 2 h.
Thereafter, the change of V
measured.
DC
v
(1 mA
at UCT +5/–0 °C is
DC
8
@ 0.2 … 2 s).
leak
DC
11/07
(t) during test
.
v
v
shall be
shall be
Requirement
To meet the specified value.
To meet the specified value.
I
|
|
(measured in direction
of surge current)
No visible damage
|
No visible damage
|
leak
∆V/V (1 mA)
∆V/V (1 mA)
∆V/V (1 mA)
∆V/V (1 mA)
(t = 1000 h) ≤ I
|
|
|
|
≤10%
≤10%
≤10%
≤10%
leak
(t = 0 h)