MCP112-290E/TO Microchip Technology, MCP112-290E/TO Datasheet - Page 12

• Manufacturer Part Number: MCP112-290E/TO
• Description: IC SUPERVISOR 2.90V LOW TO-92
• Manufacturer: Microchip Technology
• Type: Simple Reset/Power-On Resetr

Specifications of MCP112-290E/TO

• Number Of Voltages Monitored: 1
• Output: Push-Pull, Totem Pole
• Reset: Active Low
• Voltage - Threshold: 2.9V
• Operating Temperature: -40°C ~ 125°C
• Mounting Type: Through Hole
• Package / Case: TO-92-3 (Standard Body), TO-226
• Monitored Voltage: 2.9 V
• Manual Reset: Not Resettable
• Watchdog: No Watchdog
• Supply Voltage (max): 5.5 V
• Supply Voltage (min): 1 V
• Supply Current (typ): 1.75 uA
• Maximum Operating Temperature: + 125 C
• Mounting Style: Through Hole
• Minimum Operating Temperature: - 40 C
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant
• Reset Timeout: -
• Lead Free Status / Rohs Status: Lead free / RoHS Compliant

MCP111/112
4.2
The minimum pulse width (time) required to cause a
reset may be an important criteria in the implementa-
tion of a POR circuit. This time is referred to as
transient duration and is the amount of time needed for
these supervisory devices to respond to a drop in V
The transient duration time is dependant on the magni-
tude of V
duration decreases with increases in V
Figure 4-3 shows a typical transient duration vs. reset
comparator overdrive for which the MCP111/112 will
not generate a reset pulse. It shows that the farther
below the trip point the transient pulse goes, the
duration of the pulse required to cause a reset gets
shorter. Figure 2-18 shows the transient response
characteristics for the MCP111/112.
A 0.1 µF bypass cap mounted as close as possible to
the V
(refer to Figure 4-1).
FIGURE 4-3:
Transient Duration Waveform.
DS21889B-page 12
5V
0V
DD
Negative Going V
TRIP
pin provides additional transient immunity
– V
DD
t
TRANS
. Generally speaking, the transient
Time (µs)
Example of Typical
V
TRIP(MIN)
DD
Transients
- V
TRIP
DD
V
V
– V
TRIP(MAX)
TRIP(MIN)
DD
.
DD
.
4.3
The time-out period (t
device remains in the reset condition. This is affected
by both V
Figures 2-22,
response for different V
Effect of Temperature on Time-out
Period (t
DD
and temperature. The graph shown in
2-23 and
RPU
RPU
DD
 2004 Microchip Technology Inc.
)
) determines how long the
values and temperatures.
2-24 show the typical