MCP111-475E/TO Microchip Technology, MCP111-475E/TO Datasheet - Page 12

IC VOLT DET 4.63V LOW TO-92

MCP111-475E/TO

Manufacturer Part Number
MCP111-475E/TO
Description
IC VOLT DET 4.63V LOW TO-92
Manufacturer
Microchip Technology
Type
Simple Reset/Power-On Resetr
Datasheets

Specifications of MCP111-475E/TO

Number Of Voltages Monitored
1
Output
Open Drain or Open Collector
Reset
Active Low
Voltage - Threshold
4.63V
Operating Temperature
-40°C ~ 125°C
Mounting Type
Through Hole
Package / Case
TO-92-3 (Standard Body), TO-226
Threshold Voltage
4.63V
No. Of Supervisors / Monitors
1
Supply Voltage Range
1V To 5.5V
Reset Type
Active-Low / Open-Drain
Supply Current
1µA
Delay Time
100µs
Digital Ic Case Style
TO-92
Monitored Voltage
4.63 V
Manual Reset
Not Resettable
Watchdog
No Watchdog
Supply Voltage (max)
5.5 V
Supply Voltage (min)
1 V
Supply Current (typ)
1.75 uA
Maximum Operating Temperature
+ 125 C
Mounting Style
Through Hole
Minimum Operating Temperature
- 40 C
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Reset Timeout
-
Lead Free Status / Rohs Status
Lead free / RoHS Compliant
MCP111/112
4.2
The minimum pulse width (time) required to cause a
reset may be an important criteria in the implementa-
tion of a POR circuit. This time is referred to as
transient duration and is the amount of time needed for
these supervisory devices to respond to a drop in V
The transient duration time is dependant on the magni-
tude of V
duration decreases with increases in V
Figure 4-3 shows a typical transient duration vs. reset
comparator overdrive for which the MCP111/112 will
not generate a reset pulse. It shows that the farther
below the trip point the transient pulse goes, the dura-
tion of the pulse required to cause a reset gets shorter.
Figure 2-18 shows the transient response characteris-
tics for the MCP111/112.
A 0.1 µF bypass cap mounted as close as possible to
the V
(refer to Figure 4-1).
FIGURE 4-3:
Transient Duration Waveform.
DS21889A-page 12
5V
0V
DD
Negative Going V
TRIP
pin provides additional transient immunity
– V
DD
t
TRANS
. Generally speaking, the transient
Time (µs)
Example of Typical
V
TRIP(MIN)
DD
Transients
- V
TRIP
DD
V
V
– V
TRIP(MAX)
TRIP(MIN)
DD
.
DD
.
4.3
The time-out period (t
device remains in the reset condition. This is affected
by both V
Figures 2-22, 2-23 and 2-24 show typical response for
different V
Effect of Temperature on Time-out
Period (t
DD
DD
values and temperatures.
and temperature. The graph shown in
RPU
RPU
 2004 Microchip Technology Inc.
)
) determines how long the

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