STR755FV2H6 STMicroelectronics, STR755FV2H6 Datasheet - Page 53
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STR755FV2H6
Manufacturer Part Number
STR755FV2H6
Description
MCU 32BIT 256K FLASH 100-LFBGA
Manufacturer
STMicroelectronics
Series
STR7r
Datasheet
1.STR750FV0T6.pdf
(84 pages)
Specifications of STR755FV2H6
Core Processor
ARM7
Core Size
32-Bit
Speed
60MHz
Connectivity
I²C, SPI, SSI, SSP, UART/USART
Peripherals
DMA, PWM, WDT
Number Of I /o
72
Program Memory Size
256KB (256K x 8)
Program Memory Type
FLASH
Ram Size
16K x 8
Voltage - Supply (vcc/vdd)
3 V ~ 5.5 V
Data Converters
A/D 16x10b
Oscillator Type
Internal
Operating Temperature
-40°C ~ 85°C
Package / Case
100-LFBGA
For Use With
MCBSTR750UME - BOARD EVAL MCBSTR750 + ULINK-MEMCBSTR750U - BOARD EVAL MCBSTR750 + ULINK2497-5748 - BOARD EVALUATION FOR STR750XF
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Eeprom Size
-
Other names
497-5871
Available stocks
Company
Part Number
Manufacturer
Quantity
Price
Company:
Part Number:
STR755FV2H6
Manufacturer:
STMicroelectronics
Quantity:
10 000
STR750Fxx STR751Fxx STR752Fxx STR755Fxx
Static and dynamic latch-up
●
●
Table 31.
1. Class description: A Class is an STMicroelectronics internal specification. All its limits are higher than the
Symbol
JEDEC specifications, that means when a device belongs to Class A it exceeds the JEDEC standard. B
Class strictly covers all the JEDEC criteria (international standard).
DLU
LU
LU: 3 complementary static tests are required on 10 parts to assess the latch-up
performance. A supply overvoltage (applied to each power supply pin) and a current
injection (applied to each input, output and configurable I/O pin) are performed on each
sample. This test conforms to the EIA/JESD 78 IC latch-up standard. For more details,
refer to the application note AN1181.
DLU: Electro-Static Discharges (one positive then one negative test) are applied to
each pin of 3 samples when the micro is running to assess the latch-up performance in
dynamic mode. Power supplies are set to the typical values, the oscillator is connected
as near as possible to the pins of the micro and the component is put in reset mode.
This test conforms to the IEC1000-4-2 and SAEJ1752/3 standards. For more details,
refer to the application note AN1181.
Static latch-up class
Dynamic latch-up class
Electrical sensitivities
Parameter
T
T
T
V
f
CK_SYS
A
A
A
DD
=+25° C
=+85° C
=+105° C
= 5.5 V, f
=32 MHz, T
OSC4M
Conditions
=4 MHz,
A
=+25° C
Electrical parameters
Class
Class A
Class A
(1)
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