C8051F302-GS Silicon Laboratories Inc, C8051F302-GS Datasheet - Page 24
C8051F302-GS
Manufacturer Part Number
C8051F302-GS
Description
IC 8051 MCU 8K FLASH 14-SOIC
Manufacturer
Silicon Laboratories Inc
Series
C8051F30xr
Specifications of C8051F302-GS
Program Memory Type
FLASH
Program Memory Size
8KB (8K x 8)
Package / Case
14-SOIC (3.9mm Width), 14-SOL
Core Processor
8051
Core Size
8-Bit
Speed
25MHz
Connectivity
SMBus (2-Wire/I²C), UART/USART
Peripherals
POR, PWM, Temp Sensor, WDT
Number Of I /o
8
Ram Size
256 x 8
Voltage - Supply (vcc/vdd)
2.7 V ~ 3.6 V
Data Converters
A/D 8x8b
Oscillator Type
External
Operating Temperature
-40°C ~ 85°C
Processor Series
C8051F3x
Core
8051
Data Bus Width
8 bit
Data Ram Size
256 B
Interface Type
I2C/SMBus/UART
Maximum Clock Frequency
25 MHz
Number Of Programmable I/os
8
Number Of Timers
3
Maximum Operating Temperature
+ 85 C
Mounting Style
SMD/SMT
3rd Party Development Tools
PK51, CA51, A51, ULINK2
Development Tools By Supplier
C8051F300DK
Minimum Operating Temperature
- 40 C
On-chip Adc
8-ch x 8-bit
A/d Bit Size
8 bit
A/d Channels Available
8
Height
1.5 mm
Length
8.65 mm
Supply Voltage (max)
3.6 V
Supply Voltage (min)
2.7 V
Width
3.9 mm
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
For Use With
770-1006 - ISP 4PORT FOR SILABS C8051F MCU336-1444 - ADAPTER PROGRAM TOOLSTICK F300
Eeprom Size
-
Lead Free Status / Rohs Status
Lead free / RoHS Compliant
Other names
336-1537-5
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C8051F300/1/2/3/4/5
2.
Table 2.1. Absolute Maximum Ratings*
24
Ambient temperature under bias
Storage Temperature
Voltage on any Port I/O Pin or RST with respect to
GND
Voltage on V
Maximum Total current through V
Maximum output current sunk by RST or any Port pin
*Note: Stresses above those listed under “Absolute Maximum Ratings” may cause permanent damage to the device.
Absolute Maximum Ratings
This is a stress rating only and functional operation of the devices at those or any other conditions above
those indicated in the operation listings of this specification is not implied. Exposure to maximum rating
conditions for extended periods may affect device reliability.
DD
with respect to GND
Parameter
DD
and GND
Rev. 2.9
Conditions
–0.3
–0.3
Min
–55
–65
—
—
Typ
—
—
—
—
—
—
Max
125
150
500
100
5.8
4.2
Units
mA
mA
°C
°C
V
V
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