MC9S12DB128CFUE Freescale Semiconductor, MC9S12DB128CFUE Datasheet - Page 103

• Manufacturer Part Number: MC9S12DB128CFUE
• Description: IC MCU 128K FLASH 2K EE 80-QFP
• Manufacturer: Freescale Semiconductor
• Series: HCS12r

Specifications of MC9S12DB128CFUE

• Core Processor: HCS12
• Core Size: 16-Bit
• Speed: 25MHz
• Connectivity: CAN, I²C, SCI, SPI
• Peripherals: PWM, WDT
• Number Of I /o: 59
• Program Memory Size: 128KB (128K x 8)
• Program Memory Type: FLASH
• Eeprom Size: 2K x 8
• Ram Size: 8K x 8
• Voltage - Supply (vcc/vdd): 2.35 V ~ 5.25 V
• Data Converters: A/D 16x10b
• Oscillator Type: Internal
• Operating Temperature: -40°C ~ 85°C
• Package / Case: 80-QFP
• Processor Series: S12D
• Core: HCS12
• Data Bus Width: 16 bit
• Data Ram Size: 8 KB
• Interface Type: CAN, SCI, SPI
• Maximum Clock Frequency: 50 MHz
• Number Of Programmable I/os: 59
• Number Of Timers: 8
• Maximum Operating Temperature: + 85 C
• Mounting Style: SMD/SMT
• 3rd Party Development Tools: EWHCS12
• Development Tools By Supplier: M68KIT912DP256
• Minimum Operating Temperature: - 40 C
• On-chip Adc: 2 (10 bit, 8 Channel)
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant

A.3.2 NVM Reliability
The reliability of the NVM blocks is guaranteed by stress test during qualification, constant process
monitors and burn-in to screen early life failures.
The failure rates for data retention and program/erase cycling are specified at the operating conditions
noted.
The program/erase cycle count on the sector is incremented every time a sector or mass erase event is
executed.
4. Burst Programming operations are not applicable to EEPROM
5. Minimum Erase times are achieved under maximum NVM operating frequency f
6. Minimum time, if first word in the array is not blank
7. Maximum time to complete check on an erased block
NOTE:
NOTE:
NOTE:
Conditions are shown in Table A-4 unless otherwise noted
Num C
1
2
All values shown in Table A-12 are target values and subject to further extensive
characterization
Flash cycling performance is 10 cycles at -40˚C to +125˚C. Data retention is
specified for 15 years.
EEPROM cycling performance is 10K cycles at -40˚C to 125˚C. Data retention is
specified for 5 years on words after cycling 10K times. However if only 10 cycles
are executed on a word the data retention is specified for 15 years.
C Flash/EEPROM (-40˚C to +125˚C)
C EEPROM (-40˚C to +125˚C)
Table A-12 NVM Reliability Characteristics
Freescale Semiconductor, Inc.
For More Information On This Product,
Rating
Go to: www.freescale.com
MC9S12DT128B Device User Guide — V01.09
Cycles
10,000
10
NVMOP
Data Retention
.
Lifetime
15
5
Years
Years
Unit