MC9S12DB128CPVE Freescale Semiconductor, MC9S12DB128CPVE Datasheet - Page 114

• Manufacturer Part Number: MC9S12DB128CPVE
• Description: IC MCU 128K FLASH 25MHZ 112-LQFP
• Manufacturer: Freescale Semiconductor
• Series: HCS12r

Specifications of MC9S12DB128CPVE

• Core Processor: HCS12
• Core Size: 16-Bit
• Speed: 25MHz
• Connectivity: CAN, I²C, SCI, SPI
• Peripherals: PWM, WDT
• Number Of I /o: 91
• Program Memory Size: 128KB (128K x 8)
• Program Memory Type: FLASH
• Eeprom Size: 2K x 8
• Ram Size: 8K x 8
• Voltage - Supply (vcc/vdd): 2.35 V ~ 5.25 V
• Data Converters: A/D 16x10b
• Oscillator Type: Internal
• Operating Temperature: -40°C ~ 85°C
• Package / Case: 112-LQFP
• Controller Family/series: HCS12/S12X
• No. Of I/o's: 91
• Eeprom Memory Size: 2048Byte
• Ram Memory Size: 8192Byte
• Cpu Speed: 25MHz
• Rohs Compliant: Yes
• Package: 112LQFP
• Family Name: HCS12
• Maximum Speed: 50 MHz
• Operating Supply Voltage: 3.3|5 V
• Data Bus Width: 16 Bit
• Number Of Programmable I/os: 91
• Interface Type: CAN/SCI/SPI
• On-chip Adc: 2(8-chx10-bit)
• Number Of Timers: 8
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant

Device User Guide — 9S12DT128DGV2/D V02.15
Conditions are shown in (Table A-4) unless otherwise noted
Num C
NOTES:
1. T
2. Typical data retention values are based on intrinsic capability of the technology measured at high temperature and de-rated
3. Spec table quotes typical endurance evaluated at 25 C for this product family, typical endurance at various temperature
114
1
2
3
4
5
6
7
8
application.
to 25 C using the Arrhenius equation. For additional information on how Freescale defines Typical Data Retention, please
refer to Engineering Bulletin EB618.
can be estimated using the graph below. For additional information on how Freescale defines Typical Endurance, please
refer to Engineering Bulletin EB619.
Javg
C
C
C
C
C
C
C
C
will not exeed 85 C considering a typical temperature profile over the lifetime of a consumer, industrial or automotive
Data retention after 10,000 program/erase cycles at an
average junction temperature of T
Data retention with <100 program/erase cycles at an
average junction temperature T
Number of program/erase cycles
(–40 C
Number of program/erase cycles
(0 C
Data retention after up to 100,000 program/erase cycles
at an average junction temperature of T
Data retention with <100 program/erase cycles at an
average junction temperature T
Number of program/erase cycles
(–40 C
Number of program/erase cycles
(0 C < T
T
J
J
T
T
J
J
140 C)
140 C)
0 C)
0 C)
Table A-12 NVM Reliability Characteristics
Rating
Javg
Javg
EEPROM Reliability Characteristics
Javg
Flash Reliability Characteristics
85 C
85 C
Javg
85 C
85 C
Symbol
t
t
EEPRET
FLRET
n
n
EEP
FL
100,000
10,000
10,000
10,000
Min
15
20
15
20
1
100,000
300,000
Freescale Semiconductor
100
100
100
100
Typ
—
—
2
2
2
2
3
3
Max
—
—
—
—
—
—
—
—
Cycles
Cycles
Years
Years
Unit