ARR05B104KGS Kemet, ARR05B104KGS Datasheet - Page 3

• Manufacturer Part Number: ARR05B104KGS
• Description: CAP .1UF 50V CER HIGH TEMP RAD
• Manufacturer: Kemet
• Series: ARr

Specifications of ARR05B104KGS

• Capacitance: 0.1µF
• Voltage - Rated: 50V
• Tolerance: ±10%
• Temperature Coefficient: X7R
• Mounting Type: Through Hole
• Operating Temperature: -55°C ~ 200°C
• Features: High Temperature
• Applications: General Purpose
• Package / Case: Radial
• Size / Dimension: 0.200" L x 0.200" W (5.08mm x 5.08mm)
• Thickness: 2.54mm Max
• Lead Spacing: 0.200" (5.08mm)
• Lead Style: Straight
• Voltage Rating: 50 Volts
• Termination Style: Radial
• Operating Temperature Range: - 55 C to + 200 C
• Product: High Temperature MLCCs
• Dimensions: 0.1 in W x 0.2 in L x 0.2 in H
• Dielectric Characteristic: X7R
• Material, Element: Ceramic
• Termination: Radial
• Voltage, Rating: 50 VDC
• Dissipation Factor Df: 2.5
• Lead Free Status / RoHS Status: Contains lead / RoHS non-compliant
• Ratings: -
• Lead Free Status / Rohs Status: Lead free / RoHS Compliant

GENERAL SPECIFICATIONS
Working Voltage:
Temperature Characteristics:
Capacitance Tolerance:
Construction:
Termination Material:
Solderability:
Terminal Strength:
Resistance to Solvents:
Resistance to Soldering Heat:
ELECTRICAL
Capacitance @ 25°C:
Dissipation Factor @ 25°C:
Insulation Resistance @25°C:
Dielectric Withstanding Voltage:
Within specified tolerance and following test conditions per MIL-
MIL-STD 202, Method 302
MIL-STD 202, Method 301
C0G
X7R
X5U
C0G
X7R
X5U
C0G
X7R
X5U
Epoxy encapsulated - meets flame test requirements
High-temperature solder - meets EIA RS-198, Method 302,
Check individual Series: Part Number and Ordering Information
MIL-STD 202, Method 208
(Test Method: ANSI/J-STD-002)
Test A for through-hole mount and surface mount leaded.
Test B for surface mount leadless components.
MIL-STD 202, Method 208, Condition A (2.3kg or 5 lbs)
MIL-STD 202, Method 215
MIL-STD 202, Method 210, Test Condition C
50, 100, 200, 500, 1k, 2k, 3k, 4k, 5k, 7.5k, 10k,
of UL Standard 94V-0.
C0G, X7R & X5U
15k, 20k
20k, 30k, 40k, 50k
3k, 4k, 5k, 7.5k, 10k, 15k, 20k
0 + 30 PPM / °C from - 55°C to + 125°C (1)
+ 15% from - 55°C to + 125°C
+ 22%, -56% from -55°C to + 85°C
+0.5pF, +1%, +2%, +5%, +10%
±5%, ±10%, ±20%, +80% / -20%, +100% / -0%
±5%, ±10%, ±20%, +80% / -20%, +100% / -0%
Condition B (260°C for 10 seconds)
for Termination Materials offered in each series.
STD 202, Method 305.
> 100pF with 1.0 vrms @ 1 kHz with 1.0 vrms
< 100pF with 1.0 vrms @ 1 MHz with 1.0 vrms
Same test conditions as capacitance.
C0G & X7R:
100 gigohm or 1 gigohm x uF, whichever is less.
<500V test @ rated voltage, >1kV test @ 500V.
X5U:
10 gigohm or 100 megohm x uF, whichever is less.
<500V test @ rated voltage, >1kV test @ 500V.
<200V test @ 250% of rated voltage
500V to 1250V test @ 150% of rated voltage
>1251V test @ 120% of rated voltage
50, 100, 200, 500, 1k, 2k, 3k, 4k, 5k, 7.5k, 10k, 15k,
C0G - 0.15% maximum
X7R - 2.5% maximum
X5U - 2.5% maximum
© KEMET Electronics Corporation • PO Box 5928 • Greenville, SC 29606 • www.kemet.com
High Temperature, High Voltage
Performance Characteristics
ENVIRONMENTAL
Vibration:
Shock:
Life Test:
<200V
>500V
Post Test Limits @ 25°C are:
Moisture Resistance:
Thermal Shock:
(1)
(2)
MIL-STD 202, Method 204, Condition D (20g)
MIL-STD 202, Method 213, Condition I (100g)
MIL-STD 202, Method 108
MIL-STD 202, Method 106
Post Test Limits @ 25°C are:
C0G - 200% rated voltage @ +125°C
X7R - 200% rated voltage @ +125°C
C0G - rated voltage @ +125°C
X7R - rated voltage @ +125°C
X5U - rated voltage @ +85°C
Capacitance Change:
Dissipation Factor:
Insulation Resistance:
Capacitance Change:
Dissipation Factor:
Insulation Resistance:
C0G (< 200V) - +3% or 0.25pF, whichever is greater.
C0G (> 500V) - +3% or 0.50pF, whichever is greater.
X7R - + 20% of initial value (2)
C0G - 0.25% maximum
X7R & X5U - 3.0% maximum
C0G & X7R:
100 gigohm or 1 gigohm x uF, whichever is less.
<500V test @ rated voltage, >1kV test @ 500V.
X5U:
10 gigohm or 100 megohm x uF, whichever is less.
<500V test @ rated voltage, >1kV test @ 500V.
C0G (< 200V) - +3% or 0.25pF, whichever is greater.
C0G (> 500V) - +3% or 0.50pF, whichever is greater.
X7R - + 20% of initial value (2)
C0G - 0.25% maximum
X7R & X5U - 3.0% maximum
C0G & X7R:
100 gigohm or 1 gigohm x uF, whichever is less.
<500V test @ rated voltage, >1kV test @ 500V.
X5U:
10 gigohm or 100 megohm x uF, whichever is less.
<500V test @ rated voltage, >1kV test @ 500V.
MIL-STD 202, Method 107, Condition A
C0G & X7R: -55°C to 125°C
X5U: -55°C to 85°C
+53 PPM -30 PPM/ °C from +25°C to -55°C, + 60 PPM
below 10pF.
X7R & X5U dielectrics exhibit aging characteristics;
therefore, it is highly recommended that capacitors be
deaged for 2 hours at 150°C and stabilized at room tem-
perature for 48 hours before capacitance measurements
are made.
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