MAX4945AELA+T Maxim Integrated Products, MAX4945AELA+T Datasheet - Page 8

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MAX4945AELA+T

Manufacturer Part Number
MAX4945AELA+T
Description
IC CTLR OVP W/FET 5.80V 8-UDFN
Manufacturer
Maxim Integrated Products
Datasheet

Specifications of MAX4945AELA+T

Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Other names
MAX4945AELA+T
MAX4945AELA+TTR
Overvoltage-Protection Controllers with
Internal FET
ed device does not allow current to flow into OUT. The
pFET is turned off when the voltage between GP and IN
is less than the pFET gate threshold voltage.
ESD performance depends on a number of conditions.
The MAX4943–MAX4946/MAX4949 are specified for
±15kV (HBM) typical ESD resistance on IN when IN is
bypassed to ground with a 1µF ceramic capacitor.
Figure 4 shows the Human Body Model and Figure 5
shows the current waveform it generates when dis-
charged into a low impedance. This model consists of a
100pF capacitor charged to the ESD voltage of interest,
which is then discharged into the device through a
1.5kΩ resistor.
The IEC 61000-4-2 standard covers ESD testing and
performance of finished equipment. It does not specifi-
cally refer to integrated circuits. The MAX4943–
MAX4946/MAX4949 are specified for ±15kV Air-Gap
Discharge and ±8kV Contact Discharge IEC 61000-4-2
on the IN pin when IN is bypassed to ground with a 1µF
ceramic capacitor.
The major difference between tests done using the
Human Body Model and IEC 61000-4-2 is a higher peak
current in IEC 61000-4-2, due to lower series resistance.
8
_______________________________________________________________________________________
TO μC
V
ESD Test Conditions
ADAPTER
I/0
Human Body Model
5V AC
ACOK
IEC 61000-4-2
GND
30ms (typ)
TIMER
GP
DEBOUNCE
15ms (typ)
MAX4943–MAX4946/MAX4944L/
IN
MAX4945L/MAX4949
Hence, the ESD withstand voltage measured to IEC
61000-4-2 generally is lower than that measured using the
Human Body Model. Figure 6 shows the IEC 61000-4-2
model. The Contact Discharge method connects the
probe to the device before the probe is charged. The
Air-Gap Discharge test involves approaching the device
with a charged probe.
PROCESS: BiCMOS
Figure 6. IEC 61000-4-2 ESD Test Model
1μF
VOLTAGE
SOURCE
HIGH-
DC
CHARGE
PUMP
CHARGE-CURRENT-
LIMIT RESISTOR
50MΩ TO 100MΩ
OUT
Typical Operating Circuit
R
C
150pF
C s
CHARGER
STORAGE
CAPACITOR
RESISTANCE
DISCHARGE
330Ω
CONVERTER
R
D
DC-DC
Chip Information
DEVICE
UNDER
TEST

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