NE1619DS,112 NXP Semiconductors, NE1619DS,112 Datasheet - Page 14

• Manufacturer Part Number: NE1619DS,112
• Description: IC TEMP MONITOR 16SSOP
• Manufacturer: NXP Semiconductors

Specifications of NE1619DS,112

• Function: Temp Monitoring System (Sensor)
• Topology: ADC, Multiplexer, Register Bank
• Sensor Type: External & Internal
• Sensing Temperature: 0°C ~ 125°C, External Sensor
• Output Type: SMBus™
• Output Alarm: Yes
• Output Fan: No
• Voltage - Supply: 2.8 V ~ 5.5 V
• Operating Temperature: 0°C ~ 125°C
• Mounting Type: Surface Mount
• Package / Case: 16-SSOP
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant
• Other names: 568-4228-5; 935264532112; NE1619DS; NE1619DS

Philips Semiconductors
NAND-tree test
A NAND tree is provided in the NE1619 for Automated Test
Equipment (ATE) board level connectivity testing. The device is
placed into NAND tree test mode by powering up with Pin 9
(D–/NTEST_IN) held high. In this test mode Pin 16
(A0/RESET/NTEST_OUT) becomes the NAND-tree output and all
input pins become NAND-tree inputs as illustrated in Figure 12.
Table 9. NAND-tree test vectors
2004 Oct 05
HECETA4 Temperature and voltage monitor
SDA
VECTOR #
1
2
3
4
5
6
7
8
SCL
SDA
H
L
L
L
L
L
L
L
VID0
SCL
H
H
L
L
L
L
L
L
Figure 12. NAND-tree circuitry
VID0
VID1
H
H
H
L
L
L
L
L
VID1
14
H
H
H
H
L
L
L
L
VID2
To perform a NAND tree test all pins should be initially driven low.
Then one-by-one toggle them high (and keep them high), starting
with the input closest to the output, cycling toward the farthest, the
NAND tree output will toggle with each input change.
VID2
H
H
H
H
H
L
L
L
VID3
VID3
H
H
H
H
H
H
L
L
VID4
VID4
H
H
H
H
H
H
H
L
NTEST_OUT
Product data sheet
NE1619
NTEST_OUT
H
H
H
H
L
L
L
L
SL01232