CY62158ELL-45ZSXI Cypress Semiconductor Corp, CY62158ELL-45ZSXI Datasheet - Page 6

IC SRAM 8MBIT 45NS 44-TSOP

CY62158ELL-45ZSXI

Manufacturer Part Number
CY62158ELL-45ZSXI
Description
IC SRAM 8MBIT 45NS 44-TSOP
Manufacturer
Cypress Semiconductor Corp
Type
Asynchronousr

Specifications of CY62158ELL-45ZSXI

Memory Size
8M (1M x 8)
Package / Case
44-TSOP II
Format - Memory
RAM
Memory Type
SRAM
Speed
45ns
Interface
Parallel
Voltage - Supply
4.5 V ~ 5.5 V
Operating Temperature
-40°C ~ 85°C
Access Time
45 ns
Supply Voltage (max)
5.5 V
Supply Voltage (min)
4.5 V
Maximum Operating Current
25 mA
Maximum Operating Temperature
+ 85 C
Minimum Operating Temperature
- 40 C
Mounting Style
SMD/SMT
Number Of Ports
1
Operating Supply Voltage
5 V
Memory Configuration
1M X 8
Supply Voltage Range
4.5V To 5.5V
Memory Case Style
TSOP
No. Of Pins
44
Operating Temperature Range
-40°C To +85°C
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Lead Free Status / RoHS Status
Lead free / RoHS Compliant, Lead free / RoHS Compliant
Switching Characteristics
Over the Operating Range
Notes
Document #: 38-05684 Rev. *G
Read Cycle
t
t
t
t
t
t
t
t
t
t
t
Write Cycle
t
t
t
t
t
t
t
t
t
t
11. Test conditions for all parameters other than tri-state parameters assume signal transition time of 3 ns or less (1V/ns), timing reference levels of V
12. At any given temperature and voltage condition, t
13. t
14. The internal write time of the memory is defined by the overlap of WE, CE
RC
AA
OHA
ACE
DOE
LZOE
HZOE
LZCE
HZCE
PU
PD
WC
SCE
AW
HA
SA
PWE
SD
HD
HZWE
LZWE
Parameter
levels of 0 to V
can terminate a write by going INACTIVE. The data input setup and hold timing should be referenced to the edge of the signal that terminates the write.
HZOE
, t
HZCE
, and t
[14]
CC(typ)
HZWE
Read Cycle Time
Address to Data Valid
Data Hold from Address Change
CE
OE LOW to Data Valid
OE LOW to Low Z
OE HIGH to High Z
CE
CE
CE
CE
Write Cycle Time
CE
Address Setup to Write End
Address Hold from Write End
Address Setup to Write Start
WE Pulse Width
Data Setup to Write End
Data Hold from Write End
WE LOW to High Z
WE HIGH to Low Z
, and output loading of the specified I
1
1
1
1
1
1
transitions are measured when the outputs enter a high impedance state.
LOW and CE
LOW and CE
HIGH or CE
LOW and CE
HIGH or CE
LOW and CE
[11]
2
2
2
2
2
2
LOW to High Z
LOW to Power Down
[12]
HIGH to Data Valid
HIGH to Low Z
HIGH to Power Up
HIGH to Write End
[12, 13]
[12]
[12, 13]
HZCE
is less than t
OL
/I
Description
OH
[12, 13]
[12]
as shown in
LZCE
, t
1
HZOE
= V
IL
“AC Test Loads and Waveforms”
, and CE
is less than t
2
= V
LZOE
IH
. All signals must be ACTIVE to initiate a write and any of these signals
, and t
HZWE
is less than t
on page 5.
LZWE
CY62158E MoBL
Min
45
10
10
45
35
35
35
25
10
5
0
0
0
0
for any given device.
45 ns
Max
45
45
22
18
18
45
18
CC(typ)
Page 6 of 13
/2, input pulse
Unit
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
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