MC33663AJEF Freescale Semiconductor, MC33663AJEF Datasheet

no-image

MC33663AJEF

Manufacturer Part Number
MC33663AJEF
Description
LIN Transceivers dual LINcell
Manufacturer
Freescale Semiconductor
Datasheet

Specifications of MC33663AJEF

Rohs
yes
Operating Supply Voltage
7 V to 18 V
Supply Current
22 uA
Maximum Operating Temperature
+ 125 C
Package / Case
SOIC-14
Minimum Operating Temperature
- 40 C
Mounting Style
SMD/SMT
Freescale Semiconductor
Advance Information
* This document contains certain information on a new product.
Specifications and information herein are subject to change without notice.
© Freescale Semiconductor, Inc., 2012. All rights reserved.
LIN 2.1 / SAEJ2602-2 Dual LIN
Physical Layer
protocol designed to support automotive networks in conjunction with
controller area network (CAN). As the lowest level of a hierarchical
network, LIN enables cost-effective communication with sensors and
actuators when all the features of CAN are not required.
dedicated to automotive LIN sub-bus applications. The MC33663LEF
and MC33663SEF devices offer normal baud rate (20 kbps) and the
MC33663JEF slow baud rate (10 kbps). Both devices integrate fast
baud rate (above 100 kbps) for test and programming modes. They
present excellent electromagnetic compatibility (EMC) and radiated
emission performance, electrostatic discharge (ESD) robustness and
safe behavior, in the event of LIN bus short-to-ground or LIN bus
leakage during low-power mode.
Features
• Operational from V
• Compatible with LIN protocol specification 2.1, and SAEJ2602-2
• Very high immunity against electromagnetic interference
• Low standby current in Sleep mode
• Over-temperature protection
• Permanent dominant state detection
• Fast baud rate mode selection reported by RXD
• Active bus waveshaping offering excellent radiated emission
• Sustains
• 5.0 and 3.3 V compatible digital inputs without any external components required
The local interconnect network (LIN) is a serial communication
The 33663 product line integrates two physical layer LIN bus
and handles 40 V during load dump
performance
±
15.0 kV ESD IEC6100-4-2 on LIN BUS and VSUP pins
SUP
Regulator
12 V
7.0 to 18 V DC, functional up to 27 V DC,
5.0 or
3.3 V
V
BAT
Figure 1. 33663 Simplified Application Diagram
VDD
MCU
VSUP
EN1
RXD1
TXD1
EN2
RXD2
TXD2
33663
GND
WAKE1
WAKE2
INH1
INH2
LIN1
LIN2
Tape and reel orders)
(add an R2 suffix for
MC33663ASEF
MC33663ALEF
MC33663AJEF
Device
1.0 k
ORDERING INFORMATION
DUAL LIN TRANSCEIVER
1.0 k
EF SUFFIX (PB-FREE)
98ASB42565B
33663
14-PIN SOICN
Document Number: MC33663
LIN Interface 1
LIN Interface 2
Temperature
- 40 to 125°C
Range (T
A
)
Rev. 1.0, 7/2012
14 SOICN
Package

Related parts for MC33663AJEF

MC33663AJEF Summary of contents

Page 1

... This document contains certain information on a new product. Specifications and information herein are subject to change without notice. © Freescale Semiconductor, Inc., 2012. All rights reserved. Device (add an R2 suffix for Tape and reel orders) MC33663ALEF MC33663AJEF MC33663ASEF 33663 VSUP WAKE1 WAKE2 MCU ...

Page 2

... DEVICE VARIATIONS Table 1. Device Variations Freescale Part No. (Add an R2 suffix for Tape and reel orders) MC33663ALEF 20 kbps with restricted limits for transmitter MC33663ASEF MC33663AJEF 33663 2 DEVICE VARIATIONS Temperature Range (T Maximum Baud Rate 20 kbps - 40 to 125 °C and receiver symmetry 10 kbps ) Package ...

Page 3

... RxD1 35µA TxD1 WAKE1 X 1 EN2 200 kΩ RxD2 35µA TxD2 WAKE2 Figure 2. 33663 Simplified Internal Block Diagram Analog Integrated Circuit Device Data Freescale Semiconductor INTERNAL BLOCK DIAGRAM INH_ON EN_SLEEP Control Unit ( LIN Module 1) RxD_INT Receiver EN_RxD LIN_EN TxD_INT INH_ON EN_SLEEP ...

Page 4

... LIN1 in the master node application. This pin is the receiver output of the LIN1 interface, which reports the state of the bus voltage to the MCU interface. This pin controls the operation mode of the LIN1 interface. Definition Analog Integrated Circuit Device Data Freescale Semiconductor ...

Page 5

... Class D: At least one function of the Transceiver stops working properly during the test and will return into proper operation automatically when the exposure to the disturbance has ended. No physical damage of the IC occurs. Analog Integrated Circuit Device Data Freescale Semiconductor ELECTRICAL CHARACTERISTICS MAXIMUM RATINGS ...

Page 6

... Class D: At least one function of the Transceiver stops working properly during the test and will return into proper operation automatically when the exposure to the disturbance has ended. No physical damage of the IC occurs. 33663 6 Symbol V INH ( INH(S1) ( INH(S2a) ( INH(S3a) ( INH(S3b) Value Unit 0.3 SUP -100 +75 -150 +100 Analog Integrated Circuit Device Data Freescale Semiconductor ...

Page 7

... WAKE1, WAKE2 (2*18 kΩ serial resistor) (2.0 kΩ / 330 pF) - Powered - Contact discharge LIN1, LIN2 pins without capacitor LIN1, LIN2 pins with 220 pF capacitor VSUP (10 µF to ground) WAKE1, WAKE2 (2*18 kΩ serial resistor) Analog Integrated Circuit Device Data Freescale Semiconductor Symbol = 1500 Ω) = 100 pF, R ZAP ZAP V ...

Page 8

... Value 125 150 150 STG R 150 °C/W θ JA Note 5 PPRT 150 to 200 SHUT 20 HYST R [Ω] Remarks (Note) GND ) SUP Analog Integrated Circuit Device Data Freescale Semiconductor Unit °C °C ° C °C °C ...

Page 9

... Figure 5. Test Circuit for Transient Test Pulses (WAKE1,WAKE2) DUT GND Figure 6. Test Circuit for Transient Test Pulses (LIN1,LIN2) DUT GND Figure 7. Test Circuit for Transient Test Pulses (INH1,INH2) Analog Integrated Circuit Device Data Freescale Semiconductor 1.0 nF WAKE Note Waveform per ISO 7637-2. Test Pulses 1, 2a, 3a, 3b. ...

Page 10

... V OH Min Typ Max Unit 7.0 13.5 18.0 V 6.7 – – – 3.5 – 5.3 – 270 – 5.8 – 6.7 – 130 – mV μA – 12.0 22 – – 36 – 48 140 mA – 4.0 5.0 – 6.0 8.0 mA – 8.0 9.0 – 12.0 13.0 – 12.0 13.0 – 12.0 16.0 V 0.0 – 0.9 V 4.25 – 5.25 3.0 – 3.5 Analog Integrated Circuit Device Data Freescale Semiconductor ...

Page 11

... Node has to sustain the current that can flow under this condition. The bus must remain operational under this condition. 11. LIN threshold for a dominant state. 12. LIN threshold for a recessive state. Analog Integrated Circuit Device Data Freescale Semiconductor ≤ °C ≤ T ≤ 125 °C, GND = 0 V, unless otherwise noted. SUP °C under nominal conditions, unless otherwise noted. ...

Page 12

... Analog Integrated Circuit Device Data Typ Max Unit V SUP 0.5 0.525 V SUP – 0.175 – 0.3 V SUP – 11.5% V BAT – 11.5% V BAT 4.3 5 kΩ – 160 200 °C 20 – °C Ω – – 30 μA – 5.0 160 200 °C 20 – °C Freescale Semiconductor ...

Page 13

... Hysteresis ( < SUP Wake-up Input Current (V < WAKE Analog Integrated Circuit Device Data Freescale Semiconductor ≤ °C ≤ T ≤ 125 °C, GND = 0 V, unless otherwise noted. SUP °C under nominal conditions, unless otherwise noted. A Symbol < ...

Page 14

... Measurement thresholds: 50% of TXD and C BUS Figure 8. Min Typ Max D1 0.396 – – D2 – – 0.581 D3 0.417 – – D4 – – 0.590 – – 100 FAST (19) -7.25 – 7.25 Analog Integrated Circuit Device Data Freescale Semiconductor Unit kBit/s μs ...

Page 15

... See Figures 14, 18, 22, and 23 27. See Figures 16, 22, and 23 Analog Integrated Circuit Device Data Freescale Semiconductor ≤ °C ≤ T ≤ 125 °C, GND = 0 V, unless otherwise noted. SUP °C under nominal conditions, unless otherwise noted. A Symbol t = MAX ( REC_PD ...

Page 16

... LIN RXD C GND 0 : 1.0 kΩ/1.0 nF, 660 Ω/6.8 nF, and 500 Ω/10 nF. Note R and Analog Integrated Circuit Device Data Min Typ Max Unit 3.75 5.0 6.25 ms — μs — — 45 12.5 — — µs µs 12.5 — — µs 12.5 — — µs 1.875 6.25 Freescale Semiconductor ...

Page 17

... SUP TH REC(MIN) 25. SUP DOM(MIN) RXD Output of receiving Node 1 t REC_PDF(1) RXD Output of receiving Node 2 Figure 10. LIN1, LIN2 Timing Measurements for Slow Baud Rate (33663J) Analog Integrated Circuit Device Data Freescale Semiconductor TBIT (MAX) t BUS_REC t (MIN) BUS_DOM t BUS_REC t REC_PDR(1) t REC_PDR(2) TBIT ...

Page 18

... REC_PDF_FAST Figure 13. LIN1, LIN2 Receiver Timing LIN Slope 1.0 V/ns 33663 18 60% V SUP 40% V SUP t TRAN_PDR40% t TRAN_PDR60% LIN BUS SIGNAL t REC_PDR Figure 12. LIN1, LIN2 Receiver Timing 1V/ns LIN BUS SIGNAL t REC_PDR_FAST LIN BUS SIGNAL V SUP V SUP V SUP Analog Integrated Circuit Device Data Freescale Semiconductor ...

Page 19

... EN2 INH2 Normal Mode TXD2 LIN2 RXD2 WAKE2 Figure 14. LIN Module 1 EN1 Pin Wake-up with TXD1 High & LIN Module 2 in Normal Mode Analog Integrated Circuit Device Data Freescale Semiconductor FUNCTIONAL DIAGRAMS EN1 INH1 Normal Mode TXD1 LIN1 RXD1 WAKE1 LIN2 ...

Page 20

... INH2 t EN2 FIRST_DOM TXD2 (High or Low) LIN2 RXD2 Awake Mode (High Z) Figure 16. LIN Module 1 Wake1 Pin Wake-up with TXD1 Low & LIN Module 2 Wake2 Pin Wake-up with TXD2 High 33663 20 Normal Mode Normal Mode Analog Integrated Circuit Device Data Freescale Semiconductor ...

Page 21

... TXD (12.5 μ LIN RXD Figure 19. Fast Baud Rate Selection (Toggle Function) for LIN1 or LIN2 Analog Integrated Circuit Device Data Freescale Semiconductor No wake-up t>t WUF (High Z) Preparation to Sleep Mode Sleep Mode Awake No communication available Mode Wake & LIN wake-up events ...

Page 22

... VSUP EN1 INH1 LIN1 in Normal Mode TXD1 LIN1 RXD1 EN2 LIN2 in Normal Mode INH2 TXD2 LIN2 RXD2 Figure 21. Power Up and Down Sequences V UVL POR (3.5-5.3 V) (High or Low) (High or Low) (High Z) (High or Low) (High or Low) (High Z) Analog Integrated Circuit Device Data Freescale Semiconductor ...

Page 23

... INH EN TXD LIN RXD WAKE WAKE after deglitcher Communication Mode Figure 22. Sleep Mode Sequence for LIN1 or LIN2 Analog Integrated Circuit Device Data Freescale Semiconductor t LWUE (High Preparation to Sleep Mode Device in No communication allowed LIN & Wake wake up events not taken ...

Page 24

... WF Awake Mode Device in Communication Mode The device does not enter in Sleep Mode = Sleep Awake Mode Mode t LWUE No communication allowed (High Awake Mode Sleep Mode (t < Preparation to SD Analog Integrated Circuit Device Data Freescale Semiconductor ...

Page 25

... The 33663 is tested according to the application conditions (i.e. in normal mode and recessive state during communication). The transmitter has a 20 kbps baud rate (Normal baud rate) for the 33663L and 33663S devices kbps baud rate (Slow baud rate) for the 33663J device. Analog Integrated Circuit Device Data Freescale Semiconductor FUNCTIONAL DESCRIPTION INTRODUCTION FUNCTIONAL PIN DESCRIPTION falls below 6.7 V. Supply current in the Sleep mode is typically 6.0 μ ...

Page 26

... The device enters into Fast Baud Rate at room and hot 200 kΩ LIN_RXD VSUP EN_RXD 30 k Receiver Slope Control Figure 24. RXD interface is 3 set at 5.0 V, RXD flag the Fast 5 Ω LIN is 5.0 V. The RXD1 and RXD2 V level can be OH Analog Integrated Circuit Device Data Freescale Semiconductor ...

Page 27

... Important The WAKE1 (WAKE2) pin should not be left open. If the wake-up function is not used, WAKE1 (WAKE2) should be connected to ground to avoid a false wake-up. Analog Integrated Circuit Device Data Freescale Semiconductor level follows EN1 (EN2) pin high level. One LIN Module enters the Sleep Mode OH (70 µ ...

Page 28

... LIN Module 1 returns in Normal mode. LWUE and the WAKE1 pin must stay in the same state (High SD Figure 23. . LWUE , then the LIN Module 1 goes into Sleep SD , then the LIN Module 1 goes SD , then the LIN Module 1 goes in Awake Mode. Analog Integrated Circuit Device Data Freescale Semiconductor ...

Page 29

... INH HIGH and RXD pulled LOW. See LOW to HIGH and stays HIGH for a delay higher than t before transmitting the first dominant bit. Analog Integrated Circuit Device Data Freescale Semiconductor is above the Power-On Reset voltage, both LIN Modules automatically switch SUP WUF delay before transmitting the first dominant bit ...

Page 30

... Condition LIN Module returns in gone same functional mode Condition Device returns in same gone functional mode Condition LIN Module returns in gone same functional mode Condition LIN Module returns in gone same functional mode Analog Integrated Circuit Device Data Freescale Semiconductor ...

Page 31

... Slow Baud Rate for 33662J Fast Baud Rate (> 100 kbps) for 33662L, 33662S & 33662J X = Don’t care. Analog Integrated Circuit Device Data Freescale Semiconductor EN1 HIGH TO LOW for t >t LWUE EN1 HIGH TO LOW for t >t (1) Internal WAKE1 State changes during t ...

Page 32

... The LIN 2.1 physical layer and is backward compatible with the LIN 1.3 physical layer, but not the other way around. The LIN 2.1 physical layer sets harder requirements, i.e. a node using the LIN 2.1 physical layer can operate in a LIN 1.3 cluster. 33663 32 Analog Integrated Circuit Device Data Freescale Semiconductor ...

Page 33

... An additional pull-up resistor of 1.0 kΩ in series with a diode must be added when the device is used in the master node. Regulator 12V I/O RXD1 TXD1 MCU I/O_2 RXD2 TXD2 *: Optional 2.2k Analog Integrated Circuit Device Data Freescale Semiconductor TYPICAL APPLICATION C2 100nF VSUP INH2 WAKE1 33663 C3 100nF EN1 INH1 LIN MODULE 1 ...

Page 34

... PACKAGING PACKAGE DIMENSIONS Important For the most current revision of the package, visit www.Freescale.com and do a keyword search on the 98A. Dimensions shown are provided for reference ONLY. 33663 34 PACKAGING PACKAGE DIMENSIONS EF SUFFIX 14-PIN 98ASB42565B REVISION J Analog Integrated Circuit Device Data Freescale Semiconductor ...

Page 35

... Analog Integrated Circuit Device Data Freescale Semiconductor EF SUFFIX 14-PIN 98ASB42565B REVISION J PACKAGING PACKAGE DIMENSIONS 33663 35 ...

Page 36

... REVISION HISTORY REVISION DATE DESCRIPTION OF CHANGES • Initial Release. 7/2012 1.0 33663 36 REVISION HISTORY Analog Integrated Circuit Device Data Freescale Semiconductor ...

Page 37

... Freescale, the Freescale logo, AltiVec, C-5, CodeTest, CodeWarrior, ColdFire, C-Ware, Energy Efficient Solutions logo, mobileGT, PowerQUICC, QorIQ, Qorivva, StarCore, and Symphony are trademarks of Freescale Semiconductor, Inc., Reg. U.S. Pat. & Tm. Off. Airfast, BeeKit, BeeStack, ColdFire+, CoreNet, Flexis, MagniV, MXC, Platform in a Package, Processor expert, QorIQ Qonverge, QUICC Engine, Ready Play, SMARTMOS, TurboLink, Vybrid, and Xtrinsic are trademarks of Freescale Semiconductor, Inc ...

Related keywords