FXLP34L6X Fairchild Semiconductor, FXLP34L6X Datasheet - Page 2

• Manufacturer Part Number: FXLP34L6X
• Description: TRANSLATOR 1BIT UNIDIR 6MICRPAK
• Manufacturer: Fairchild Semiconductor

Specifications of FXLP34L6X

• Logic Function: Translator, Unidirectional
• Number Of Bits: 1
• Input Type: Voltage
• Output Type: Voltage
• Number Of Channels: 1
• Number Of Outputs/channel: 1
• Differential - Input:output: No/No
• Propagation Delay (max): 3ns
• Voltage - Supply: 1 V ~ 3.6 V
• Operating Temperature: -40°C ~ 85°C
• Package / Case: 6-MicroPak™
• Supply Voltage: 1 V ~ 3.6 V
• Logic Family: FXLP
• Logic Type: Voltage Level Translation
• Number Of Channels Per Chip: Single
• Polarity: Non-Inverting
• Supply Voltage (max): 3.6 V
• Supply Voltage (min): 1 V
• Maximum Operating Temperature: + 85 C
• Mounting Style: SMD/SMT
• High Level Output Current: - 2.6 mA
• Input Bias Current (max): 0.9 uA
• Low Level Output Current: 2.6 mA
• Minimum Operating Temperature: - 40 C
• Propagation Delay Time: 48.6 ns @ 1 V
• Number Of Lines (input / Output): 1 / 1
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant
• Data Rate: -
• Lead Free Status / Rohs Status: Lead free / RoHS Compliant
• Other names: FXLP34L6XTR; FXLP34L6X_NL; FXLP34L6X_NLTR; FXLP34L6X_NLTR

package assembled at Hana-Ayutthaya.
Change From
Change To
Results/Discussion for Qual Plan Number - Q20070331
Test: (Autoclave) | Conditions: 100%RH, 121C | Standard: JESD22-A102
Lot
Q20070331AAACLVB
Q20070331BAACLVB
Q20070331CAACLVB
Q20070331DAACLVB
Test: (C Scanning Acoustical Microscope) | Conditions: | Standard:
Lot
Q20070331AACSAM1B
Q20070331AACSAM2B
Q20070331BACSAM1B
Q20070331BACSAM2B
Q20070331CACSAM1B
Q20070331CACSAM2B
Q20070331DACSAM1B
Q20070331DACSAM2B
Test: (Construction Analysis) | Conditions: | Standard:
Lot
Q20070331AACONSTB
Q20070331BACONSTB
Q20070331CACONSTB
Q20070331DACONSTB
Test: (Flammability Certificate (3)) | Conditions: | Standard: UL94-0
Lot
Q20070331AAFLAMB
Q20070331BAFLAMB
Q20070331CAFLAMB
Q20070331DAFLAMB
Test: (High Temperature Storage Life) | Conditions: 150C | Standard: JESD22-A103
Lot
Q20070331AAHTSLB
Q20070331BAHTSLB
Q20070331CAHTSLB
Q20070331DAHTSLB
Test: (Highly Accelerated Stress Test) | Conditions: 85%RH, 110C, 0V | Standard: JESD22-A110
Lot
Q20070331AAHAST2B
Device
FSA2257L10X
NC7SZ125L6X
FHP3131IL6X
NC7SZ74L8X
Device
FSA2257L10X
NC7SZ125L6X
FHP3131IL6X
NC7SZ74L8X
Device
FSA2257L10X
NC7SZ125L6X
FHP3131IL6X
NC7SZ74L8X
Device
FSA2257L10X
NC7SZ125L6X
FHP3131IL6X
NC7SZ74L8X
Device
FSA2257L10X
NC7SZ125L6X
FHP3131IL6X
NC7SZ74L8X
Device
FSA2257L10X
Setpoint
96-HOURS
96-HOURS
96-HOURS
96-HOURS
Setpoint
Setpoint
Setpoint
Setpoint
168-HOURS
1000-HOURS
168-HOURS
1000-HOURS
168-HOURS
1000-HOURS
168-HOURS
1000-HOURS
Setpoint
264-HOURS
Result
0/77
0/77
0/77
0/77
Result
0/10
0/10
0/10
0/10
0/10
0/10
0/10
0/10
Result
0/10
0/10
0/10
0/10
Result
0/1
0/1
0/1
0/1
Result
0/77
0/77
0/77
0/77
0/77
0/77
0/77
0/77
Result
0/45
Failure Code
Failure Code
Failure Code
Failure Code
Failure Code
Failure Code
Pg. 2