AM27C4096 Advanced Micro Devices, AM27C4096 Datasheet - Page 9

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AM27C4096

Manufacturer Part Number
AM27C4096
Description
4 Megabit (256 K x 16-Bit) CMOS EPROM
Manufacturer
Advanced Micro Devices
Datasheet

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TEST CONDITIONS
SWITCHING TEST WAVEFORM
KEY TO SWITCHING WAVEFORMS
Note:
Diodes are IN3064 or equivalents.
Note: For C
0.45 V
2.4 V
Device
Under
Test
WAVEFORM
L
= 100 pF.
Input
Figure 3. Test Setup
C L
2.0 V
0.8 V
Test Points
Don’t Care, Any Change Permitted
6.2 k
2.0 V
0.8 V
Does Not Apply
5.0 V
INPUTS
Output
2.7 k
11408F-7
11408F-8
Am27C4096
Changing from H to L
Changing from L to H
Output Load
Output Load Capacitance, C
(including jig capacitance)
Input Rise and Fall Times
Input Pulse Levels
Input timing measurement reference
levels
Output timing measurement
reference levels
Steady
Center Line is High Impedance State (High Z)
Test Condition
Table 1. Test Specifications
Changing, State Unknown
OUTPUTS
L
1 TTL gate
0.45–2.4
0.8, 2.0
0.8, 2.0
100
All
20
KS000010-PAL
Unit
pF
ns
V
V
V
9

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