HCS109D Intersil Corporation, HCS109D Datasheet - Page 6

• Manufacturer Part Number: HCS109D
• Description: Radiation Hardened Dual JK Flip Flop
• Manufacturer: Intersil Corporation

NOTES:
NOTE:
NOTES:
1. Alternate group A testing in accordance with method 5005 of MIL-STD-883 may be exercised.
2. Table 5 parameters only.
1. Except FN test which will be performed 100% Go/No-Go.
1. Each pin except VCC and GND will have a resistor of 10K
2. Each pin except VCC and GND will have a resistor of 1K
Initial Test (Preburn-In)
Interim Test I (Postburn-In)
Interim Test II (Postburn-In)
PDA
Interim Test III (Postburn-In)
PDA
Final Test
Group A (Note 1)
Group B
Group D
Group E Subgroup 2
STATIC BURN-IN I TEST CONNECTIONS (Note 1)
STATIC BURN-IN II TEST CONNECTIONS (Note 1)
DYNAMIC BURN-IN TEST CONNECTIONS (Note 2)
CONFORMANCE
6, 7, 9, 10
6, 7, 9, 10
CONFORMANCE GROUPS
OPEN
GROUPS
-
NOTE: Each pin except VCC and GND will have a resistor of 47K
Subgroup B-5
Subgroup B-6
6, 7, 9, 10
Group E, Subgroup 2, sample size is 4 dice/wafer 0 failures.
1 - 5, 8, 11 - 15
OPEN
GROUND
METHOD
TABLE 8. STATIC AND DYNAMIC BURN-IN TEST CONNECTIONS
5005
8
8
TABLE 9. IRRADIATION TEST CONNECTIONS
Specifications HCS109MS
TABLE 7. TOTAL DOSE IRRADIATION
TABLE 6. APPLICABLE SUBGROUPS
Sample/5005
Sample/5005
Sample/5005
Sample/5005
100%/5004
100%/5004
100%/5004
100%/5004
100%/5004
100%/5004
100%/5004
1/2 VCC = 3V 0.5V
METHOD
PRE RAD
1, 7, 9
GROUND
6, 7, 9, 10
8
-
-
5% for dynamic burn-in
5% for static burn-in
108
TEST
1, 2, 3, 7, 8A, 8B, 9, 10, 11, Deltas
1, 2, 3, 7, 8A, 8B, 9, 10, 11
GROUP A SUBGROUPS
POST RAD
2, 3, 8A, 8B, 10, 11
VCC = 6V
Table 4
1, 5, 11, 15, 16
1, 7, 9, Deltas
1, 7, 9, Deltas
1 - 5, 11 - 16
1, 7, 9
1, 7, 9
1, 7, 9
1, 7, 9
1, 7, 9
1, 7, 9
16
VCC = 5V
1 - 5, 11 - 16
0.5V
5% for irradiation testing.
PRE RAD
0.5V
1, 9
READ AND RECORD
50kHz
4, 12
ICC, IOL/H
ICC, IOL/H
ICC, IOL/H
ICC, IOL/H
Subgroups 1, 2, 3, 9, 10, 11,
(Note 2)
-
-
READ AND RECORD
OSCILLATOR
Spec Number
Table 4 (Note 1)
POST RAD
2, 3, 13, 14
25kHz
-
-
518748