FSL13A0D3 INTERSIL [Intersil Corporation], FSL13A0D3 Datasheet

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FSL13A0D3

Manufacturer Part Number
FSL13A0D3
Description
9A, 100V, 0.180 Ohm, Rad Hard, SEGR Resistant, N-Channel Power MOSFETs
Manufacturer
INTERSIL [Intersil Corporation]
Datasheet
9A, 100V, 0.180 Ohm, Rad Hard, SEGR
Resistant, N-Channel Power MOSFETs
The Discrete Products Operation of Intersil has developed a
series of Radiation Hardened MOSFETs specifically
designed for commercial and military space applications.
Enhanced Power MOSFET immunity to Single Event Effects
(SEE), Single Event Gate Rupture (SEGR) in particular, is
combined with 100K RADS of total dose hardness to provide
devices which are ideally suited to harsh space
environments. The dose rate and neutron tolerance
necessary for military applications have not been sacrificed.
The Intersil portfolio of SEGR resistant radiation hardened
MOSFETs includes N-Channel and P-Channel devices in a
variety of voltage, current and on-resistance ratings.
Numerous packaging options are also available.
This MOSFET is an enhancement-mode silicon-gate power
field-effect transistor of the vertical DMOS (VDMOS)
structure. It is specially designed and processed to be
radiation tolerant. The MOSFET is well suited for
applications exposed to radiation environments such as
switching regulation, switching converters, motor drives,
relay drivers and drivers for high-power bipolar switching
transistors requiring high speed and low gate drive power.
This type can be operated directly from integrated circuits.
Reliability screening is available as either commercial, TXV
equivalent of MIL-S-19500, or Space equivalent of
MIL-S-19500. Contact Intersil for any desired deviations
from the data sheet.
Ordering Information
Formerly available as type TA17696.
10K
10K
100K
100K
100K
RAD LEVEL
Commercial
TXV
Commercial
TXV
Space
SCREENING LEVEL PART NUMBER/BRAND
4-1
Data Sheet
FSL13A0D1
FSL13A0D3
FSL13A0R1
FSL13A0R3
FSL13A0R4
CAUTION: These devices are sensitive to electrostatic discharge; follow proper IC Handling Procedures.
Features
• 9A, 100V, r
• Total Dose
• Single Event
• Dose Rate
• Photo Current
• Neutron
Symbol
Package
- Meets Pre-RAD Specifications to 100K RAD (Si)
- Safe Operating Area Curve for Single Event Effects
- SEE Immunity for LET of 36MeV/mg/cm
- Typically Survives 3E9 RAD (Si)/s at 80% BV
- Typically Survives 2E12 if Current Limited to I
- 1.5nA Per-RAD(Si)/s Typically
- Maintain Pre-RAD Specifications
- Usable to 3E14 Neutrons/cm
1-888-INTERSIL or 321-724-7143 | Copyright © Intersil Corporation 2000
V
V
for 3E13 Neutrons/cm
DS
GS
up to 80% of Rated Breakdown and
of 10V Off-Bias
June 1999
DS(ON)
FSL13A0D, FSL13A0R
= 0.180
G
TO-205AF
2
D
G
S
File Number
2
D
S
2
with
DSS
DM
4480.2

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FSL13A0D3 Summary of contents

Page 1

... MIL-S-19500, or Space equivalent of MIL-S-19500. Contact Intersil for any desired deviations from the data sheet. Ordering Information RAD LEVEL SCREENING LEVEL PART NUMBER/BRAND 10K Commercial FSL13A0D1 10K TXV FSL13A0D3 100K Commercial FSL13A0R1 100K TXV FSL13A0R3 100K Space FSL13A0R4 Formerly available as type TA17696. ...

Page 2

Absolute Maximum Ratings T C Drain to Source Voltage . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ...

Page 3

Source to Drain Diode Specifications PARAMETER SYMBOL Forward Voltage V Reverse Recovery Time Electrical Specifications up to 100K RAD PARAMETER Drain to Source Breakdown Volts (Note 3) Gate to Source Threshold Volts (Note 3) Gate to Body Leakage (Notes 2, ...

Page 4

Typical Performance Curves - CASE TEMPERATURE ( C FIGURE 3. MAXIMUM CONTINUOUS DRAIN CURRENT vs TEMPERATURE Q 12V CHARGE BASIC GATE CHARGE ...

Page 5

Typical Performance Curves Test Circuits and Waveforms ELECTRONIC SWITCH OPENS WHEN CURRENT I AS TRANSFORMER - VARY t TO OBTAIN P 50 REQUIRED PEAK 20V FIGURE 9. ...

Page 6

Screening Information Screening is performed in accordance with the latest revision in effect of MIL-S-19500, (Screening Information Table). Delta Tests and Limits (JANTXV Equivalent, JANS Equivalent) PARAMETER Gate to Source Leakage Current Zero Gate Voltage Drain Current On Resistance Gate ...

Page 7

Rad Hard Data Packages - Intersil Power Transistors TXV Equivalent 1. RAD HARD TXV EQUIVALENT - STANDARD DATA PACKAGE A. Certificate of Compliance B. Assembly Flow Chart C. Preconditioning - Attributes Data Sheet D. Group A - Attributes Data Sheet ...

Page 8

TO-205AF 3 LEAD JEDEC TO-205AF HERMETIC METAL CAN PACKAGE ØD Ø Ø All Intersil semiconductor products are manufactured, assembled and tested under ...

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