S-8241ABRMC-GBRT2G SII [Seiko Instruments Inc], S-8241ABRMC-GBRT2G Datasheet - Page 12

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S-8241ABRMC-GBRT2G

Manufacturer Part Number
S-8241ABRMC-GBRT2G
Description
BATTERY PROTECTION IC FOR 1-CELL PACK
Manufacturer
SII [Seiko Instruments Inc]
Datasheet
*1. Since products are not screened at high and low temperature, the specification for this temperature range is guaranteed by
*1. Since products are not screened at high and low temperature, the specification for this temperature range is guaranteed by
12
DELAY TIME (Ta = 25 °C)
DELAY TIME (Ta = −40 to +85 °C)
DELAY TIME (Ta = 25 °C)
DELAY TIME (Ta = −40 to +85 °C)
Overcharge detection delay time
Overdischarge detection delay time
Overcurrent 1 detection delay time
Overcurrent 2 detection delay time
Load short-circuiting detection delay time
Overcharge detection delay time
Overdischarge detection delay time
Overcurrent 1 detection delay time
Overcurrent 2 detection delay time
Load short-circuiting detection delay time
Overcharge detection delay time
Overdischarge detection delay time
Overcurrent 1 detection delay time
Overcurrent 2 detection delay time
Load short-circuiting detection delay time
Overcharge detection delay time
Overdischarge detection delay time
Overcurrent 1 detection delay time
Overcurrent 2 detection delay time
Load short-circuiting detection delay time
BATTERY PROTECTION IC FOR 1-CELL PACK
S-8241 Series
3 Detection delay time
design, not tested in production.
design, not tested in production.
(1) S-8241ABA, S-8241ABC, S-8241ABD, S-8241ABE, S-8241ABF, S-8241ABG, S-8241ABH,
(2) S-8241ABB, S-8241ABO, S-8241ABP, S-8241ABS, S-8241ACI, S-8241ACK, S-8241ACN,
S-8241ABI, S-8241ABK, S-8241ABL, S-8241ABQ, S-8241ABT, S-8241ABU, S-8241ABV,
S-8241ABX, S-8241ABZ, S-8241ACA, S-8241ACB, S-8241ACE, S-8241ACF, S-8241ACG,
S-8241ACH, S-8241ACL, S-8241ACO, S-8241ACP, S-8241ACQ, S-8241ACR, S-8241ACS,
S-8241ACT, S-8241ACU, S-8241ACX, S-8241ACY, S-8241ADA, S-8241ADD, S-8241ADH,
S-8241ADL, S-8241ADM, S-8241ADN, S-8241ADO, S-8241ADQ, S-8241ADT, S-8241ADV
S-8241ACZ, S-8241ADE
Item
Item
*1
*1
Symbol
Symbol
t
t
t
t
t
t
t
t
t
t
t
t
t
t
t
t
t
t
t
t
CU
DL
lOV1
lOV2
SHORT
CU
DL
IOV1
IOV2
SHORT
CU
DL
lOV1
lOV2
SHORT
CU
DL
IOV1
IOV2
SHORT
Seiko Instruments Inc.
Condition
Condition
Table 10
Table 11
87.5
0.55
87.5
Min.
Min.
0.7
5.6
1.4
4.4
1.1
1.4
1.1
69
21
11
69
17
9
Typ.
Typ.
125
125
125
125
1.0
1.0
10
10
31
16
10
31
16
10
8
2
8
2
2
2
162.5
162.5
Max.
Max.
10.4
212
212
1.3
2.6
1.7
3.4
2.6
3.4
50
14
73
41
21
50
53
27
73
Unit
Unit
ms
ms
ms
ms
ms
ms
ms
ms
ms
ms
ms
ms
ms
ms
μs
μs
μs
μs
s
s
Condition
Condition
Rev.7.6
Test
Test
8
8
9
9
9
8
8
9
9
9
8
8
9
9
9
8
8
9
9
9
Circuit
Circuit
Test
Test
_00
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1

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