SST39SF010A-45-4C-NH SST [Silicon Storage Technology, Inc], SST39SF010A-45-4C-NH Datasheet - Page 8

• Manufacturer Part Number: SST39SF010A-45-4C-NH
• Description: 1 Mbit / 2 Mbit / 4 Mbit (x8) Multi-Purpose Flash
• Manufacturer: SST [Silicon Storage Technology, Inc]

TABLE 5: DC O
TABLE 6: R
TABLE 7: C
TABLE 8: R
©2001 Silicon Storage Technology, Inc.
Symbol
I
I
I
I
I
V
V
V
V
V
Symbol
T
T
Parameter
C
C
Symbol
N
T
I
DD
SB1
SB2
LI
LO
LTH
PU-READ
PU-WRITE
DR
IL
IH
IHC
OL
OH
I/O
IN
END
1. This parameter is measured only for initial qualification and after a design or process change that could affect this parameter.
1. This parameter is measured only for initial qualification and after a design or process change that could affect this parameter.
1. This parameter is measured only for initial qualification and after a design or process change that could affect this parameter.
1
1
1
1
1
1
1
Parameter
Power Supply Current
Read
Write
Standby V
(TTL input)
Standby V
(CMOS input)
Input Leakage Current
Output Leakage Current
Input Low Voltage
Input High Voltage
Input High Voltage (CMOS)
Output Low Voltage
Output High Voltage
ECOMMENDED
APACITANCE (Ta = 25°C, f=1 Mhz, other pins open)
ELIABILITY
PERATING
Parameter
Power-up to Read Operation
Power-up to Program/Erase Operation
Description
I/O Pin Capacitance
Input Capacitance
Parameter
Endurance
Data Retention
Latch Up
DD
DD
Current
Current
C
HARACTERISTICS
C
S
YSTEM
HARACTERISTICS
P
OWER
-
UP
V
DD
Min
V
2.0
2.4
T
DD
-0.3
IMINGS
Minimum Specification
= 5.0V±10%
SST39SF010A / SST39SF020A / SST39SF040
Limits
1 Mbit / 2 Mbit / 4 Mbit Multi-Purpose Flash
Max
100
0.8
0.4
25
25
10
3
1
8
100 + I
10,000
Units
100
mA
mA
mA
µA
µA
µA
V
V
V
V
V
DD
Test Conditions
Address input=V
V
CE#=OE#=V
CE#=WE#=V
CE#=V
CE#=V
V
V
V
V
V
I
I
OL
OH
OUT
DD
IN
DD
DD
DD
=2.1 mA, V
=GND to V
=-400 µA, V
=V
=V
=V
=V
=GND to V
DD
DD
DD
DD
IH
IHC
, V
Max
Min
Max
Max
, V
Units
DD
Test Condition
Cycles
Years
DD
IL
IL
mA
=V
DD
DD
, WE#=V
, OE#=V
Minimum
DD
=V
V
V
DD
, V
IL
=V
DD
I/O
IN
=V
/V
DD
100
100
, V
DD
DD
= 0V
= 0V
Max
IH
DD
DD
Max
=V
, at f=1/T
Test Method
JEDEC Standard A117
JEDEC Standard A103
JEDEC Standard 78
Preliminary Specification
Min
IH
IH
=V
Min
DD
, all I/Os open
DD
Max
Max
RC
S71147-02-000 5/01
Min
Maximum
Units
12 pF
6 pF
µs
µs
T5.4 398
T6.1 398
T7.0 398
T8.1 398
398