gs881z36bgd-250v GSI Technology, gs881z36bgd-250v Datasheet - Page 5

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gs881z36bgd-250v

Manufacturer Part Number
gs881z36bgd-250v
Description
9mb Pipelined And Flow Through Synchronous Nbt Sram
Manufacturer
GSI Technology
Datasheet
100-Pin TQFP Pin Descriptions
Rev: 1.01 4/2007
Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com.
Symbol
DQP
DQP
A
DQP
DQP
V
TMS
TDO
ADV
CKE
DQ
DQ
DQ
DQ
LBO
TCK
V
V
TDI
CK
NC
0
ZZ
B
B
B
B
E
E
E
FT
DDQ
W
G
A
, A
DD
SS
A
B
C
D
1
2
3
C
D
A
B
A
B
C
D
1
Type
I/O
I/O
I/O
I/O
I/O
I/O
I/O
I/O
In
In
In
In
In
In
In
In
In
In
In
In
In
In
In
In
In
In
In
In
Chip Enable—Active High. For self decoded depth expansion
Chip Enable—Active Low. For self decoded depth expansion
5/37
Advance/Load; Burst address counter control pin
Byte Write signal for data inputs DQ
Byte Write signal for data inputs DQ
Byte Write signal for data inputs DQ
Byte Write signal for data inputs DQ
Burst Address Inputs; Preload the burst counter
Pipeline/Flow Through Mode Control; active low
Clock Input Buffer Enable; active low
Byte A Data Input and Output pins
Byte B Data Input and Output pins
Byte C Data Input and Output pins
Byte D Data Input and Output pins
Power down control; active high
Linear Burst Order; active low.
Output driver power supply
Output Enable; active low
Write Enable; active low
9th Data I/O Pin; Byte A
9th Data I/O Pin; Byte B
9th Data I/O Pin; Byte C
9th Data I/O Pin; Byte D
Chip Enable; active low
Scan Test Mode Select
Scan Test Data Out
Core power supply
Clock Input Signal
Scan Test Data In
Scan Test Clock
Description
Address Inputs
No Connect
Ground
C
D
A
B
GS881Z18/32/36B(T/D)-xxxV
; active low
; active low
; active low
; active low
© 2006, GSI Technology

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