74lvt20db NXP Semiconductors, 74lvt20db Datasheet - Page 3

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74lvt20db

Manufacturer Part Number
74lvt20db
Description
3.3v Dual 4-input Nand Gate
Manufacturer
NXP Semiconductors
Datasheet
1. Stresses beyond those listed may cause permanent damage to the device. These are stress ratings only and functional operation of the
2. The performance capability of a high-performance integrated circuit in conjunction with its thermal environment can create junction
3. The input and output negative voltage ratings may be exceeded if the input and output clamp current ratings are observed.
Philips Semiconductors
ABSOLUTE MAXIMUM RATINGS
NOTES:
RECOMMENDED OPERATING CONDITIONS
1996 Aug 28
SYMBOL
SYMBOL
SYMBOL
3.3V Dual 4-input NAND gate
device at these or any other conditions beyond those indicated under “recommended operating conditions” is not implied. Exposure to
absolute-maximum-rated conditions for extended periods may affect device reliability.
temperatures which are detrimental to reliability. The maximum junction temperature of this integrated circuit should not exceed 150 C.
V
T
I
I
V
V
T
I
OUT
OUT
V
I
V
I
I
I
OUT
amb
V
OK
V
OH
OL
OL
CC
IK
stg
CC
IH
IL
I
I
DC supply voltage
DC input diode current
DC input voltage
DC output diode current
DC output voltage
DC output current
DC output current
Storage temperature range
DC supply voltage
Input voltage
High-level input voltage
Low-level Input voltage
High-level output current
Low-level output current
Low-level output current; current duty cycle 50%, f
Operating free-air temperature range
PARAMETER
3
3
1, 2
PARAMETER
PARAMETER
1kHz
Output in Off or High state
3
Output in High state
Output in Low state
CONDITIONS
V
V
O
I
< 0
< 0
MIN
–40
2.7
2.0
0
–0.5 to +4.6
–0.5 to +7.0
–0.5 to +7.0
–65 to 150
RATING
LIMITS
–50
–50
–32
64
MAX
–20
+85
3.6
5.5
0.8
32
48
Product specification
74LVT20
UNIT
UNIT
UNIT
mA
mA
mA
mA
mA
mA
mA
V
V
V
V
V
V
V
C
C

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