TPCF8101 Toshiba Semiconductor, TPCF8101 Datasheet - Page 5

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TPCF8101

Manufacturer Part Number
TPCF8101
Description
Notebook PC Applications
Manufacturer
Toshiba Semiconductor
Datasheet

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120
100
2.5
1.5
0.5
80
40
10
−0.1
0
−80
3
2
1
0
0
(1) t = 5 s
(1) DC
(2) t = 5 s
(2) DC
Common source
Pulse test
V GS = −1.8 V
−2.5 V
V GS = 0 V
f = 1 MHz
Ta = 25°C
−4.5 V
−40
Drain-source voltage V
Ambient temperature Ta (°C)
Ambient temperature Ta (°C)
40
I D = −1.5 A
Capacitance – V
−1
0
R
DS (ON)
(1) Device mounted on a
(2) Device mounted on a
P
D
glass-epoxy board (a) (Note 2a)
glass-epoxy board (b) (Note 2b)
40
80
– Ta
I D = −1.5, −2.5, −6 A
I D = −2.5 A
I D = −1.5 A
– Ta
−10
80
DS
C oss
C rss
C iss
DS
120
(V)
120
−6 A
−2.5 A
−100
160
160
5
−100
−2.0
−1.5
−1.0
−0.5
−10
−20
−16
−12
−1
−8
−4
−80
0
0
0
0
Common source
Ta = 25°C
Pulse test
−2.5 V
Common source
V DS = −10 V
I D = −200 μA
Pulse test
Dynamic input/output characteristics
−4.5 V
−1.8 V
−40
V DS
0.4
Drain-source voltage V
Ambient temperature Ta (°C)
8
Total gate charge Q
−1 V
0
0.8
16
I
V GS = 0 V
DR
V
−2.5 V
th
– V
40
−5 V
– Ta
DS
1.2
24
V DD = −10 V
g
80
V GS
DS
(nC)
Common source
I D = −6 A
Ta = 25°C
Pulse test
(V)
1.6
32
www.DataSheet4U.com
120
TPCF8101
2006-11-16
160
2.0
40
−20
−16
−12
−8
−4
0

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