JANTX1N5554 Microsemi, JANTX1N5554 Datasheet

no-image

JANTX1N5554

Manufacturer Part Number
JANTX1N5554
Description
(1N5550 / 1N5551 / 1N5552 / 1N5553 / 1N5554)
Manufacturer
Microsemi
Datasheet
1.JANTX1N5554.pdf (28 pages)
*
* 1.1 Scope. This specification covers the performance requirements for silicon, general purpose, semiconductor
diodes. Four levels of product assurance are provided for each encapsulated device type as specified in
MIL-PRF-19500. Two levels of product assurance are provided for each unencapsulated device type.
through 1N5554US, and figures 3, 4, 5, 6, and 7 for JANHC and JANKC die.
AMSC N/A
The documentation and process conversion
measures necessary to comply with this revision
shall be completed by 19 July 2004.
1N5550, 1N5550US
1N5551, 1N5551US
1N5552, 1N5552US
1N5553, 1N5553US
1N5554, 1N5554US
1. SCOPE
1.2 Physical dimensions. See figure 1 (similar to DO-41) for 1N5550 through 1N5554, figure 2 for 1N5550US
1.3 Maximum ratings. Unless otherwise specified, T
(1) Derate linearly at 41.6 mA/ C above T
(2) An I
(3) Does not apply to surface mount devices.
(4) Derate linearly at 25 mA/ C above T
* Comments, suggestions, or questions on this document should be addressed to Defense Supply Center,
Columbus, ATTN: DSCC-VAC, P.O. Box 3990, Columbus, OH 43216-5000, or emailed to
Semiconduction@dscc.dla.mil
this address information using the ASSIST Online database at http://www.dodssp.daps.mil.
maximum junction temperature at or below +200 C as proven by the junction temperature rise test (see 6.5).
Barometric pressure reduced:
1N5550, 1N5551, 1N5552 - 8 mmHg (100,000 feet).
1N5553, 1N5554
Col. 1
Type
O
of up to 6 A dc is allowable provided that appropriate heat sinking or forced air cooling maintains the
The requirements for acquiring the product described herein shall consist of
this specification sheet and MIL-PRF-19500.
* SEMICONDUCTOR DEVICE, DIODE, SILICON, POWER, RECTIFIER,
TYPES 1N5550 THROUGH 1N5554, 1N5550US THROUGH 1N5554US,
JAN, JANTX, JANTXV, JANS, JANHCA, JANHCB, JANHCC, JANHCD,
1,000
Col. 2
V
200
400
600
800
(BR)
This specification is approved for use by all Departments
and Agencies of the Department of Defense.
- 33 mmHg (70,000 feet).
. Since contact information can change, you may want to verify the currency of
1,000
V
JANHCE, JANKCA, JANKCD, AND JANKCE
V
PERFORMANCE SPECIFICATION SHEET
Col. 3
(BR)min
200
400
600
800
V dc
and
RWM
A
L
= +55 C.
= +55 C at L = .375 inch (9.53 mm).
L = .375 inch
T
(1) (2) (3)
L
Col. 4
= +55 C;
A dc
I
O1
5
5
5
5
5
C
= +25 C and ratings apply to all case outlines.
t
T
I
p
O
A
= 1/120 s
Col. 5
= 2 A dc
A(pk)
I
= +55 C
100
100
100
100
100
FSM
-65 to +200
-65 to +200
-65 to +200
-65 to +200
-65 to +200
Col. 6
T
C
J
MIL-PRF-19500/420H
19 April 2004
SUPERSEDING
MIL-PRF-19500/420G
30 December 2002
INCH-POUND
+55 C
(2) (4)
Col. 7
T
A dc
I
O2
A
3
3
3
3
3
=
FSC 5961
-65 to +175
-65 to +175
-65 to +175
-65 to +175
-65 to +175
Col. 8
T
STG
C

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JANTX1N5554 Summary of contents

Page 1

The documentation and process conversion measures necessary to comply with this revision shall be completed by 19 July 2004. * SEMICONDUCTOR DEVICE, DIODE, SILICON, POWER, RECTIFIER, TYPES 1N5550 THROUGH 1N5554, 1N5550US THROUGH 1N5554US, JAN, JANTX, JANTXV, JANS, JANHCA, JANHCB, JANHCC, ...

Page 2

Primary electrical characteristics. Unless otherwise specified Type 1 percent duty cycle, 8.3 ms max pulse width Min V(pk) 1N5550, 1N5550US 0.6 1N5551, 1N5551US 0.6 1N5552, 1N5552US 0.6 1N5553, 1N5553US 0.6 1N5554, 1N5554US 0.6 (1) ...

Page 3

MIL-PRF-19500/420H Ltr Inches Min BL .130 BD .115 LD .037 LL .900 LU NOTES: 1. Dimensions are in inches. 2. Millimeters are given for general information only. 3. Dimensions BL and BD include all components of the diode periphery except ...

Page 4

MIL-PRF-19500/420H Dimensions Ltr Inches Min Max BL .200 .275 BD .137 .180 ECT .019 .034 S .003 NOTES: 1. Dimensions are in inches. 2. Millimeters are given for general information only. 3. Dimensions are pre-solder dip. 4. Minimum clearance of ...

Page 5

MIL-PRF-19500/420H Ltr Dimensions Inches Min Max A .085 .091 B .072 .078 C .008 .014 NOTES: 1. Dimensions are in inches. 2. Millimeters are given for general information only. 3. The physical characteristics are: Top (cathode) Au Thickness = 10,000Å ...

Page 6

MIL-PRF-19500/420H Ltr Dimensions Inches Min Max A .088 .092 2.24 B .070 .077 1.78 C .007 .035 0.18 NOTES: 1. Dimensions are in inches. 2. Millimeters are given for general information only. 3. The physical characteristics are Top (cathode) Au ...

Page 7

MIL-PRF-19500/420H Ltr Dimensions Inches Millimeters Min Max Min A .060 .065 1.52 B .052 .058 1.32 C .008 .014 0.20 NOTES: 1. Dimensions are in inches. 2. Millimeters are given for general information only. 3. The physical characteristics are Top ...

Page 8

MIL-PRF-19500/420H Ltr Inches Min Max A .081 .087 B .055 .061 C .007 .012 NOTES: 1. Dimensions are in inches. 2. Millimeters are given for general information only. 3. The physical characteristics are Top (anode) Al Thickness = 60,000Å minimum. ...

Page 9

MIL-PRF-19500/420H Ltr Inches Min Max A .081 .087 B .055 .061 C .007 .012 NOTES: 1. Dimensions are in inches. 2. Millimeters are given for general information only. 3. The physical characteristics are Top (anode) Al Thickness = 60,000Å minimum. ...

Page 10

REQUIREMENTS 3.1 General. The individual item requirements shall be as specified in MIL-PRF-19500 and as modified herein. 3.2 Qualification. Devices furnished under this specification shall be products that are manufactured by a manufacturer authorized by the qualifying activity for ...

Page 11

Qualification inspection. Qualification inspection shall be in accordance with MIL-PRF-19500 and as specified herein. 4.2.1 Group E qualification. Group E qualification shall be performed herein for qualification or requalification only. In case qualification was awarded to a prior revision ...

Page 12

Thermal impedance Z JX accordance with method 3101 of MIL-STD-750. The maximum screen limit shall be developed by the supplier using statistical methods and it shall not exceed the table I, subgroup 2 herein. See 4.4.1 for test ...

Page 13

Group B inspection. Group B inspection shall be conducted in accordance with the tests and conditions specified for subgroup testing in table VIa (JANS) and table VIb (JAN, JANTX and JANTXV) of MIL-PRF-19500. Electrical measurements (end-points) requirements shall ...

Page 14

Group C inspection, table VII of MIL-PRF-19500. Subgroup Method C2 1056 C2 1051 C2 2036 * C5 3101 or 4081 C6 1027 * 4.4.4 Group E inspection. Group E inspection shall be conducted in accordance with the conditions ...

Page 15

Thermal resistance. Thermal resistance measurements shall be conducted in accordance with test method 3101 or 4081 of MIL-STD-750. Read and record data in accordance with group E herein and shall be included in the qualification report. Forced moving air ...

Page 16

Inspection 1/ Method Subgroup 1 Visual and mechanical 2071 inspection Subgroup 2 Thermal impedance 3101 Forward voltage 4011 1N5550, 1N5550US 1N5551, 1N5551US 1N5552, 1N5552US 1N5553, 1N5553US 1N5554, 1N5554US Forward voltage 4011 Reverse current 4016 leakage 1N5550, 1N5550US 1N5551, 1N5551US 1N5552, ...

Page 17

Inspection 1/ Method Subgroup 3 High temperature operation: Reverse current leakage Reverse current 4016 leakage 1N5550, 1N5550US 1N5551, 1N5551US 1N5552, 1N5552US 1N5553, 1N5553US 1N5554, 1N5554US Forward voltage 4011 1N5550, 1N5550US 1N5551, 1N5551US 1N5552, 1N5552US 1N5553, 1N5553US 1N5554, 1N5554US Low temperature ...

Page 18

Inspection 1/ Method Subgroups 5 Not applicable Subgroup 6 Forward surge 4066 Electrical measurement Subgroup 7 Not applicable 1/ For sampling plan, see MIL-PRF-19500. MIL-PRF-19500/420H TABLE I. Group A inspection - Continued. MIL-STD-750 Conditions I = rated (see col. 6 ...

Page 19

TABLE II. Group E inspection (all quality levels) for qualification and requalification only. Inspection Method Subgroup 1 Thermal shock 1056 Temperature cycling 1051 Electrical measurements Subgroup 2 Steady state dc blocking life 1048 Electrical measurements * Subgroup 3 DPA ...

Page 20

TABLE II. Group E inspection (all quality levels) for qualification and requalification only - Continued. Inspection Method * Subgroup 8 Peak reverse power Electrical measurement Subgroup 9 1/ Resistance to glass 1057 cracking * Subgroup 10 Forward surge 4066 ...

Page 21

Step Inspection Method 1. Reverse current 4016 leaking change 2. Forward voltage 4011 change 1/ The electrical measurements for table VIa (JANS) of MIL-PRF-19500 are as follows: a. Subgroup 3, see table III herein, step 2. b. Subgroup 4, see ...

Page 22

NOTES 13T H22 on 1 inch (25.4 mm) diameter form (air core give 20 s pulse width Adjustable to 200 volts for power desired in DUT ...

Page 23

MIL-PRF-19500/420H NOTE: Blocking diode shall have a forward current rating FIGURE 10. Junction temperature rise test circuit. FIGURE 11. Junction temperature test oscillogram (typical dc. ...

Page 24

MIL-PRF-19500/420H FIGURE 12. Expanded oscillogram ...

Page 25

PACKAGING * 5.1 Packaging. For acquisition purposes, the packaging requirements shall be as specified in the contract or order (see 6.2). When actual packaging of materiel performed by DoD or in-house contractor personnel, these personnel need ...

Page 26

Maximum lead temperature +175 C with equal two-lead conditions). Inches NOTES: 1. Dimensions are in inches. 2. Millimeters are given for general information only accordance with ASME Y14.5M, diameters are equivalent to x symbology. ...

Page 27

MIL-PRF-19500/420H NOTES 1. Dimensions are in inches. 2. Millimeters are given for general information only. FIGURE 14. Maximum current vs lead temperature. 27 ...

Page 28

Suppliers of die. The qualified die suppliers with the applicable letter version (example JANHCA1N5550) will be identified on the QML. PIN 14552 1N5550 JANHCA1N5550 JANHCB1N5550 JANKCA1N5550 1N5551 JANHCA1N5551 JANHCB1N5551 JANKCA1N5551 1N5552 JANHCA1N5552 JANHCB1N5552 JANKCA1N5552 1N5553 JANHCA1N5553 JANHCB1N5553 JANKCA1N5553 1N5554 ...

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