L3100B1 STMicroelectronics, L3100B1 Datasheet - Page 4

• Manufacturer Part Number: L3100B1
• Description: Overvoltage And Overcurrent Protection For Telecom Line
• Manufacturer: STMicroelectronics

L3100B/L3100B1
REFERENCE TEST CIRCUIT FOR I
FUNCTIONAL HOLDING CURRENT (I
4/8
TEST PROCEDURE :
This is a GO-NOGO Test which allows to confirm the holding current (I
circuit.
This test can be performed if the reference test circuit can’t be implemented.
TEST PROCEDURE :
- For Bidirectional devices = Switch K is closed
- For Unidirectional devices = Switch K is open.
- Device with V
- Device with V
Pulse Test duration (tp = 20ms):
V
1) Adjust the current level at the I
2) Fire the D.U.T with a surge Current : Ipp = 10A , 10/1000 s.
3) The D.U.T will come back to the OFF-State within a durationof 50 ms max.
OUT
V
BAT
Selection
= - 48 V
- V
- V
OUT
Transformer
OUT
220V/2A
BO
BO
Auto
= 480 V
= 250 V
200 Volt
200 Volt
Transformer
220V/800V
RMS
5A
RMS
R
BO
, R
, R
H
2
and V
V out
1
) TEST CIRCUIT = GO - NOGO TEST.
= 240 .
H
= 140 .
value by short circuiting the AK of the D.U.T.
static
relay.
BO
parameters:
measure
tp = 20ms
I BO
K
D.U.T.
140
240
R1
R2
D.U.T
measure
H
) level in a functionaltest
V BO
Surge generator
- V
P