BTM1A Agere Systems, BTM1A Datasheet - Page 13

• Manufacturer Part Number: BTM1A
• Description: Dual Differential Transceivers--BTK1A And BTM1A
• Manufacturer: Agere Systems

October 2001
Agere Systems Inc.
Latch-Up
Latch-up evaluation has been performed on the data transmission receivers. Latch-up testing determines if the
power-supply current exceeds the specified maximum due to the application of a stress to the device under test. A
device is considered susceptible to latch-up if the power supply current exceeds the maximum level and remains at
that level after the stress is removed.
Agere performs latch-up testing per an internal test method which is consistent with JEDEC Standard No. 17
(previously JC-40.2) CMOS Latch-Up Standardized Test Procedure.
Latch-up evaluation involves the following three separate stresses to evaluate latch-up susceptibility levels:
1. dc current stressing of input and output pins.
2. Power supply slew rate.
3. Power supply overvoltage.
Table 10. Latch-Up Test Criteria and Test Results
Based on the results in Table 10, the data transmission receivers pass the Agere latch-up testing requirements and
are considered not susceptible to latch-up.
Data Transmission
Receiver ICs
Minimum Criteria
Test Results
dc Current Stress
of I/O Pins
150 mA
250 mA
Power Supply
Slew Rate
100 ns
1 µs
BTK1A and BTM1A
Power Supply
Overvoltage
1.75 x Vmax
2.25 x Vmax
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