AD7825 Analog Devices, AD7825 Datasheet - Page 6

• Manufacturer Part Number: AD7825
• Description: 3 V/5 V, 2 MSPS, 8-Bit, 1-/4-/8-Channel Sampling ADCs
• Manufacturer: Analog Devices

Specifications of AD7825

• Resolution (bits): 8bit
• # Chan: 4
• Sample Rate: 2MSPS
• Interface: Par
• Analog Input Type: SE-Uni
• Ain Range: 2 V p-p,2.5V p-p
• Adc Architecture: Pipelined
• Pkg Type: DIP,SOIC,SOP

AD7822/AD7825/AD7829
ABSOLUTE MAXIMUM RATINGS
T
Table 3.
Parameter
V
V
Analog Input Voltage to AGND
Reference Input Voltage to AGND
V
Digital Input Voltage to DGND
Digital Output Voltage to DGND
Operating Temperature Range
Storage Temperature Range
Junction Temperature
PDIP Package, Power Dissipation
SOIC Package, Power Dissipation
TSSOP Package, Power Dissipation
ESD
ESD CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily accumulate on
the human body and test equipment and can discharge without detection. Although this product features
proprietary ESD protection circuitry, permanent damage may occur on devices subjected to high energy
electrostatic discharges. Therefore, proper ESD precautions are recommended to avoid performance
degradation or loss of functionality.
DD
DD
MID
A
V
Industrial (B Version)
θ
Lead Temperature, (Soldering, 10 sec)
θ
Lead Temperature, Soldering
θ
Lead Temperature, Soldering
= 25°C, unless otherwise noted.
to AGND
to DGND
JA
JA
JA
IN1
Input Voltage to AGND
Vapor Phase (60 sec)
Infrared (15 sec)
Vapor Phase (60 sec)
Infrared (15 sec)
Thermal Impedance
Thermal Impedance
Thermal Impedance
to V
IN8
Rating
−0.3 V to +7 V
−0.3 V to +7 V
−0.3 V to V
−0.3 V to V
−0.3 V to V
−0.3 V to V
−0.3 V to V
−40°C to +85°C
−65°C to +150°C
150°C
450 mW
105°C/W
450 mW
75°C/W
215°C
220°C
128°C/W
215°C
220°C
1 kV
260°C
450 mW
DD
DD
DD
DD
DD
+ 0.3 V
+ 0.3 V
+ 0.3 V
+ 0.3 V
+ 0.3 V
Rev. C | Page 6 of 28
Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only; functional operation of the device at these or any
other conditions above those indicated in the operational
section of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.